| Sample Type | Solids, Liquids, Powders, Alloys and Thin Films | Solids, slurries, liquids, powders, alloys, coatings, and thin films | Solids, liquids, powders, alloys and thin films | Solids, Liquids, Powders, Alloys and Thin Films |
| Description | The Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
Especially designed and engineered for heavy The Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX QC+ QuantEZ add to its broad appeal for an ever-expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX QC+ QuantEZ series is the reliable choice for routine elemental analysis.
50 kV X-ray Tube and SDD
The shuttered 50kV X-ray tube and Peltier cooled silicon drift detector (SDD) detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
Options: Autosampler, Helium, and FP
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.
NEX QC+ QuantEZ Features & Benefits- Analyze sodium (Na) to uranium (U) non-destructively
- Powerful QuantEZ Windows-based software
- Solids, liquids, alloys, powders, and thin films
- 50 kV X-ray tube for wide elemental coverage
- Silicon drift detector (SDD) for superior resolution
- Multiple automated tube filters
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters
... Read More | The Rigaku NEX CG II is a fast and powerful XRF spectrometer that pushes the boundaries of EDXRF technology. It delivers rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased The Rigaku NEX CG II is a fast and powerful XRF spectrometer that pushes the boundaries of EDXRF technology. It delivers rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased signal-to-noise, even for challenging samples, making it an excellent choice for industrial quality control to advanced research applications.
The NEX CG II is a multi-purpose elemental analyzer that delivers rapid qualitative and quantitative elemental analyses and addresses needs across many industries. It is suited to chemical analysis in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
Cartesian Geometry and Polarization for Trace Level Sensitivity
Unlike conventional energy dispersive X-ray fluorescence (EDXRF) spectrometers, NEX CG II is an indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.
Features:
- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
- Indirect excitation for exceptionally low detection limits
- High-power 50 kV, 50 W X-ray tube
- Large-area high-throughput silicon drift detector (SDD)
- Analysis in air, helium, or vacuum
- Powerful and easy to use QuantEZ® software with multilingual user interface
- Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
- Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
- Various automatic sample changers accommodating up to 52 mm samples
- Low cost of ownership backed by a 2-year warranty
... Read More | The Rigaku NEX DE Series spectrometers deliver wide elemental coverage. Non-destructively analyze sodium (Na) through uranium (U) in almost any matrix — from solids and alloys to powders, liquids, and slurries.
The Rigaku NEX DE Series high-performance EDXRF spectrometers deliver routine elemental The Rigaku NEX DE Series spectrometers deliver wide elemental coverage. Non-destructively analyze sodium (Na) through uranium (U) in almost any matrix — from solids and alloys to powders, liquids, and slurries.
The Rigaku NEX DE Series high-performance EDXRF spectrometers deliver routine elemental measurements across a diverse range of matrices — from homogeneous liquids of any viscosity to solids, thin films, alloys, slurries, powders, and pastes. NEX DE Series analyzers are versatile and equipped with a 60 kV, 12 W X-ray tube, and a high-throughput silicon drift detector (SDD). The SDD supports count rates over 500K cps, resulting in low limits of detection. For your small spot analysis needs, the NEX DE VS model additionally offers a high-resolution camera and automated collimators to allow for precise positioning of your sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes. These features, combined with the advanced QuantEZ software, provide unparalleled performance for both bulk (NEX DE) and bulk and small spot (NEX DE VS) analysis. Whether the need is basic quality control (QC) or its more sophisticated variants such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — NEX DE Series analyzers are the reliable choice for rapid non-destructive elemental analysis of sodium through uranium.
NEX DE Series Features & Benefits- Analyze sodium (Na) to uranium (U) non-destructively
- Powerful QuantEZ Windows-based software
- Solids, liquids, alloys, powders, and thin films
- High-resolution camera
- 1, 3, or 10 mm analysis spot size
- 60 kV X-ray tube for wide elemental coverage
- FAST SDD® (silicon drift detector) for superior data
- Six automated tube filters
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters
*FAST SDD is a registered trademark of Amptek, Inc.... Read More | The affordable Rigaku NEX QC Series EDXRF analyzers deliver rapid qualitative and quantitative determination of major and minor atomic elements. Non-destructively analyze sodium (Na) through uranium (U) in a wide variety of sample types — solids, liquids, alloys, powders, and thin films.
Among The affordable Rigaku NEX QC Series EDXRF analyzers deliver rapid qualitative and quantitative determination of major and minor atomic elements. Non-destructively analyze sodium (Na) through uranium (U) in a wide variety of sample types — solids, liquids, alloys, powders, and thin films.
Among Rigaku's line of high-value benchtop EDXRF systems, the NEX QC Series analyzers combine superior performance capabilities with affordability. Designed for rapid qualitative and quantitative elemental analysis, non-destructively analyze elements sodium through uranium in a broad range of applications. From homogenous liquids of any viscosity to solids, thin films, alloys, slurries, powders, and pastes — NEX QC Series analyzers are ideal for routine quality control. The 50 kV X-ray tube and solid state detectors offer exceptional spectral resolution and throughput. The high voltage capability, along with multiple automated tube filters, provides enhanced sensitivity and low limits of detection. Additionally, the intuitive touchscreen interface and built-in printer make these instruments easy to use and convenient. They are available in either a NEX QC or NEX QC+ model for more demanding applications, or for situations where analysis time is critical. The NEX QC+ gives significant improvements in elemental peak resolution and counting statistics, resulting in superior calibrations and precision for the most challenging measurements.
NEX QC Series Features & Benefits- Analyze sodium (Na) to uranium (U) non-destructively
- Solids, liquids, alloys, powders, and thin films
- 50 kV X-ray tube for wide elemental coverage
- Solid state detectors for superior data quality
- Intuitive touchscreen user interface
- Multiple automated tube filters for enhanced sensitivity
- Convenient built-in thermal printer
- Low cost with an unmatched performance-to-price ratio
... Read More |