X-ray fluorescence spectrometers use high-energy X-rays or gamma rays to excite fluorescent radiation (or photons) from a sample for chemical or elemental analysis. In an energy dispersive X-ray fluorescence spectrometer (EDXRF Spectrometer), the fluorescent photons from the irradiated sample are detected without being separated first (as they are in wavelength dispersive XRF spectrometers). Therefore, EDXRF spectrometers typically have better efficiency, whereas WDXRF spectrometers have better resolution. Energy Dispersive XRF Spectrometers are used to analyze solid samples and although they have broad applications as disparate as petrochemical analysis, food safety, and plastics, one of the main attractions of this technique is that it is non-destructive, which makes it very attractive for analysis of samples that are irreplaceable, such as artifacts from an archeological site. The limit of detection for EDXRF spectrometers is typically in the parts per million (ppm) range.
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| Company | Malvern Panalytical | Malvern Panalytical | Malvern Panalytical | Malvern Panalytical | Malvern Panalytical |
| Item | Epsilon Xline EDXRF | Epsilon 1 EDXRF Spectrometer | Zetium Metals Edition | Zetium Minerals Edition | Zetium Petro Edition |
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| Catalog Number | Epsilon Xline | Epsilon 1 | Zetium Metals Edition | Zetium Minerals Edition | Zetium Petro Edition |
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| Element Range | Able to measure all valuable elements of interest, including platinum and cerium | Sodium (Na) to Americium (AM) | Boron (B) to Americium (AM) | Boron (B) to Americium (AM) | Boron (B) to Americium (AM) |
| Sample Type | Coating line | Solids, Pressed/Loose Powders and Liquids/Filters | Solids, Pressed powders, and fused beads | Inquire | Inquire |
| X-Ray Tube | Ag | High-Performance Ceramic Tube, 50KV | No-drift SST R-mAX tube | Super-sharp SST R-mAX X-ray tubes | Drift-free SST R-mAX X-ray tubes with ZETA technology |
| Detector(s) | High-resolution Si drift detector SDD10 | SDD detector | Hi-Per Scint Detector, Duplex Detector | Inquire | Duplex detector |
| Sample Chamber | Inquire | 1 position | Inquire | Inquire | Inquire |
| Description | In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition?and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.
Features:
- Full in-line automation. Enjoy continuous R2R production thanks to the Epsilon Xline’s seamless integration capabilities, suitable for a range of thin-film and coating applications.
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Simple and safe. The Epsilon Xline is fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data.
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A lifetime of experience. Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today – and at the same time looking to the industry’s future together.
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Maximized yield. Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations.
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Optimum materials efficiency. Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution.
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Proven, patented accuracy. Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results.
... Read More | Epsilon 1 is the ideal addition to any institution’s analytical equipment. It is capable of simple element identification and quantification to more sophisticated analysis. Introduce students to an analytical technique widely used in industry for production and quality control, but often neglected Epsilon 1 is the ideal addition to any institution’s analytical equipment. It is capable of simple element identification and quantification to more sophisticated analysis. Introduce students to an analytical technique widely used in industry for production and quality control, but often neglected in the classroom.
The Epsilon 1 is an easy to operate, compact and X-ray safe instrument without the need for additional chemicals. Epsilon 1 can be used for educating students in lab-practicals and for research activities in a variety of disciplines, for example, chemistry, geology, archeology, environmental sciences, material sciences and forensics.... Read More | Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be equipped to perform fast small spot mapping.
Smart Zetium:
We continuously strive to help you get the most out of our instruments, and we've connected the Zetium to our Smart Manager platform. This is a cloud-based 'control room' which provides you with a clear picture of the utilization and health of your instruments, wherever they are in the world. By connecting your Zetium to the Smart Manager, we have turned it into a Smart Zetium.... Read More | The Zetium Minerals Edition XRF Spectrometer is well suited for materials analysis at all stages of mining. It is pre-configured to cover a wide range of elements at concentrations from ppm to 100%. A new faster sample changer, certification of 20 in-house samples as standards, and Virtual The Zetium Minerals Edition XRF Spectrometer is well suited for materials analysis at all stages of mining. It is pre-configured to cover a wide range of elements at concentrations from ppm to 100%. A new faster sample changer, certification of 20 in-house samples as standards, and Virtual Analyst to guide all users in application development make Zetium Minerals Edition the choice for process control in mining.
Smart Zetium:
We continuously strive to help you get the most out of our instruments, and we've connected the Zetium to our Smart Manager platform. This is a cloud-based 'control room' which provides you with a clear picture of the utilization and health of your instruments, wherever they are in the world. By connecting your Zetium to the Smart Manager, we have turned it into a Smart Zetium.... Read More | The Zetium Petro edition XRF spectrometer delivers reliable and norm-compliant elemental analysis from crude oils to fuels and petrochemicals. The Petro edition is pre-configured to produce compliant results with the appropriate hardware and your choice of compliance modules, including factory pre-The Zetium Petro edition XRF spectrometer delivers reliable and norm-compliant elemental analysis from crude oils to fuels and petrochemicals. The Petro edition is pre-configured to produce compliant results with the appropriate hardware and your choice of compliance modules, including factory pre-calibration according to international test methods. Adding the option of the innovative ED core makes it the only XRF system capable of satisfying both WDXRF and EDXRF test methods on a single instrument. The ED core can also be used to detect unexpected elements in production samples with simultaneous spectrum acquisition.... Read More |
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