Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
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| Company | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. |
| Item | FT230 | EA1000AIII and EA1400 Benchtop XRF analyzers for RoHS | EA8000A: X-ray Particle Contaminant Analyzer for Lithium-ion Battery Production | FT110A | FT160 Series |
| Catalog Number | FT230 | EA1000AIII / EA1400 | EA8000A | FT110A | FT160 |
| Price | | | | | |
| Principle | Inquire | X-ray Fluorescence | Transmission X-ray imaging and X-ray fluorescence spectroscopy | XRF Coating Thickness Gauge | Inquire |
| X-Ray Tube | Tungsten (W) target microfocus X-ray tube, top-down orientation | (Rh target) Voltage: 15 kV, 40 kV, 50 kV | Current: 1 mA (10 µA to 1,000 µA variable) Bottom-Up method. | XRF Analyzer - Small Air-cooled X-ray tube
X-ray transmission - Water-cooled X-ray tube | Air-cooled small X-Ray Tube | Inquire |
| Detector(s) | Silicon drift detector (SDD) | Silicon PIN-diode or high resolution silicon-drift detector (SDD) | High Resolution SDD | Proportional counter | Inquire |
| Analysis Diameter | Inquire | 1, 3, or 5 mm (programmable) | Inquire | Inquire | Inquire |
| Description | The FT230 is designed to simplify and accelerate testing of components and assemblies making it easier to measure more parts in less time. With features such as Find My Part™ smart recognition, automated sample focusing and a wide view camera, the FT230 reduces set up time and user error to increaseThe FT230 is designed to simplify and accelerate testing of components and assemblies making it easier to measure more parts in less time. With features such as Find My Part™ smart recognition, automated sample focusing and a wide view camera, the FT230 reduces set up time and user error to increase throughput and productivity. Let your XRF make decisions for you.
Features
- Automated focusing reduces sample loading time
- Find My Part™ smart recognition automatically sets the complete measurement routine
- Sample view is presented over a large part of the screen for excellent visibility
- Self-checking diagnostics confirms the health and stability of the instrument
- Integrates seamlessly with other software and easily exports data
- Intuitive and easy to use by non-specialists thanks to a new user interface
- Powerful to measure up to four layers at once plus the substrate
- Durable for a long-life in a challenging production or lab environment
- Conforms to ASTM B568 and DIN ISO 3497
- Helps you meet specifications for ENIG (IPC-4552B), ENEPIG (IPC-4556), immersion Sn (IPC-4554) and immersion Ag (IPC-4553A)
... Read More | Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you will be able to meet the requirements for environmental regulations.
Features
- Easy to operate
- Optional 12-position carousel for unattended analysis
- Flexible calibrations to adapt to new RoHS standards
- Automatically highlights what you’re analyzing for glanceable results
- Quick measurement
- Large chamber to fit a variety of samples
- Visual and audio measurement indicator
- Option to add coatings and elemental analysis
... Read More | The EA8000 X-ray analyzer for fast and efficient quality control in lithium-ion battery production.
Combining X-ray transmission imaging with X-ray fluorescence analysis in a single instrument, the EA8000 rapidly detects and identifies metals contaminants that are so detrimental to lithium-ion The EA8000 X-ray analyzer for fast and efficient quality control in lithium-ion battery production.
Combining X-ray transmission imaging with X-ray fluorescence analysis in a single instrument, the EA8000 rapidly detects and identifies metals contaminants that are so detrimental to lithium-ion battery (LiB) performance. Suitable for raw material testing, process control and failure analysis, the EA8000 is a powerful tool in ensuring LiBs’ quality and performance.
Features
- Fast analysis
- Automated operation
- Ability to detect contaminants below the surface
- Supports high-volume production
... Read More | The FT110A is a benchtop XRF analyzer designed to meet the challenges of in-production coatings analysis. Powerful X-ray fluorescence technology coupled with automated positioning functionality helps to increase productivity of plating shops while ensuring components meet the highest standards.
The FT110A is a benchtop XRF analyzer designed to meet the challenges of in-production coatings analysis. Powerful X-ray fluorescence technology coupled with automated positioning functionality helps to increase productivity of plating shops while ensuring components meet the highest standards.
Features
- Powerful, high-sensitivity technology delivers results in seconds
- Non-destructive testing safe for finished goods
- Automated features increase productivity
- Analyze up to four layers and the substrate, plus bath solution
- Easy to use by non-specialist operators
- Measurement methods meets ISO 3497, ASTM B568 and DIN 50987
- Large chamber accommodates a wide range of samples
- Customizable options to suit your application
... Read More | The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.
Features
The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.
Features
- Large observation window for viewing analysis from a safe distance
- Measurement methods meet standards ISO 3497, ASTM B568 and DIN 50987
- Test finishes for IPC-4552B, IPC-4553A, IPC-4554 and IPC-4556 conformity
- Automated feature location for fast sample setup
- Choice of analyzer configuration optimized for your application
- Measure nm-scale coatings on features smaller than 50 µm
- Double the analysis throughput of conventional instruments
- Accommodates large samples in a wide range of shapes
- Robust design tested for long-term production use
... Read More |
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