X-Ray Fluorescence Spectrometer (XRF Analyzer)

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X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
CompanyHitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.
ItemFT160 SeriesEA1000AIII and EA1400 Benchtop XRF analyzers for RoHSEA8000A: X-ray Particle Contaminant Analyzer for Lithium-ion Battery ProductionFT230LAB-X and X-Supreme Range Benchtop XRF elemental analysis
Catalog NumberFT160EA1000AIII / EA1400EA8000AFT230LAB-X5000 / X-Supreme8000
Price
PrincipleInquireX-ray FluorescenceTransmission X-ray imaging and X-ray fluorescence spectroscopyInquireInquire
X-Ray TubeInquire(Rh target) Voltage: 15 kV, 40 kV, 50 kV | Current: 1 mA (10 µA to 1,000 µA variable) Bottom-Up method.XRF Analyzer - Small Air-cooled X-ray tube
X-ray transmission - Water-cooled X-ray tube
Tungsten (W) target microfocus X-ray tube, top-down orientationInquire
Detector(s)InquireSilicon PIN-diode or high resolution silicon-drift detector (SDD)High Resolution SDDSilicon drift detector (SDD)Inquire
Analysis DiameterInquire1, 3, or 5 mm (programmable)InquireInquireInquire
DescriptionThe FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.

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Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you ... Read MoreThe EA8000 X-ray analyzer for fast and efficient quality control in lithium-ion battery production. Combining X-ray transmission imaging with X-ray fluorescence analysis in a single instrument, the EA8000 rapidly detects and identifies metals contaminants that are so detrimental to lithium-ion ... Read MoreThe FT230 is designed to simplify and accelerate testing of components and assemblies making it easier to measure more parts in less time. With features such as Find My Part™ smart recognition, automated sample focusing and a wide view camera, the FT230 reduces set up time and user error to increase... Read MoreXRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 and LAB-X5000 for quality assurance and process control requirements across a diverse range of applications; e.g. Petroleum & oil, wood treatment, minerals,... Read More
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