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X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
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| Company | Rigaku Americas Corporation | Rigaku Americas Corporation |
| Item | Supermini200 High-Powered Benchtop Wavelength Dispersive XRF Spectrometer | ZSX 400 Wavelength Dispersive X-ray Fluorescence Spectrometer |
| Citations | | |
| Catalog Number | Supermini200 | ZSX 400 |
| Price | | |
| Principle | Wavelength Dispersive | Wavelength Dispersive X-ray Fluorescence (WDXRF) |
| X-Ray Tube | 200 W (air-cooled) | End window, Rh-anode, 3kW or 4 kW, 60kV |
| Goniometer Type | Inquire | Inquire |
| Detector(s) | Light elements: F-PC (gas flow proportional counter), heavy elements; and SC (scintillation counter) | Heavy element detector - Scintillation counter (SC), Light element detector - Flow proportional counter (F-PC), Attenuator - In-out automatic exchanger (1/10) |
| Analysis Diameter | 44 mm (sample size) | 30 to 0.5 mm |
| Description | The new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku The new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD).
Low cost of ownership
Not only is the Rigaku Supermini200 an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. The Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.
Superior light element performance
Analyzing complex matrix materials with a wide range of light and heavy elements, from trace to high concentration levels, is the instrument's core competency. Rigaku Supermini200 delivers high sensitivity for light elements with superior spectral resolution for resolving line overlaps in complex matrices without the need for deconvolution. Analyzing low concentration levels of light elements (F, Na, Mg, Ca, Si, Al, and P) is easy.
High power X-ray tube
Supermini is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.
Features:
- Analyze fluorine through uranium (F -> U)
- Analyze: solids, liquids, powders, alloys and thin films
- Atmosphere: air, helium or vacuum
- X-ray tube: 50 kV, 200 W Pd-anode
- Primary beam filter: Zr is standard; Al optional
- Detectors: F-PC and scintillation
- Crystals: 3-position changer
- Autosampler: 12-position standard
- Vacuum: rotary pump standard
- Power: 100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A
... Read More | Rigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magneticRigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.
Customized sample adapter system
Having the versatility to adapt to your specific sample types and analysis needs, the ZSX 400 is adaptable to various sample sizes and shapes using optional (made to order) adapter inserts. With a variable measurement spot (30 mm to 0.5 mm diameter with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity, this uniquely flexible instrument can dramatically streamline your quality control processes.
Sample view camera with special lighting
Optional real-time camera allows the analysis point to be viewed on screen. The operator has complete certainty as to what is being measured.
Traditional WDXRF analytical capabilities
All analytical capabilities of a traditional instrument are retained in this "large sample" variant. Analyze beryllium (Be) through uranium (U) with high-resolution, high-precision WDXRF spectroscopy, from solids to liquids and powders to thin films. Analyze wide composition ranges (ppm to tens of percent) and thicknesses (sub Å to mm). Optionally available is diffraction peak interference rejection, for optimal results for single-crystal substrates. The Rigaku ZSX 400 complies with industry standards SEMI and CE.
Features
- Large sample analysis
- Up to 400 mm (diameter)
- Up to 50 mm (thickness)
- Up to 30 kg (mass)
- Sample adapter system
- Adaptable to various sample sizes
- Measurement spot
- 30 mm to 0.5 mm diameter
- 5-step automatic selection
- Mapping capability
- Allows multipoint measurements
- Sample view camera (option)
- General purpose
- Analyze Be - U
- Elemental range: ppm to %
- Thickness range: sub Å to mm
- Diffraction interference rejection (option)
- Accurate results for single-crystal substrates
- Compliance with industry standards
- Small footprint
50% footprint of the previous model ... Read More |
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