X-Ray Fluorescence spectrometers (XRF) use high energy X-rays (or gamma rays) to excite fluorescent radiation or photons from a sample for elemental analysis. In wavelength dispersive x-ray fluorescence spectroscopy (WDXRF), photons emitted by the sample are separated or dispersed by diffraction before hitting the detector. This is accomplished by placing an analyzing crystal between the sample and the detector. Therefore, WDXRF spectrometers have better resolution than energy dispersive x-ray fluorescence spectrometers which do not contain an analyzing crystal. However, due to the increase in optical components, WDXRF spectrometers typical have a lower efficiency than EDXRF spectrometers and, hence, require a higher power x-ray tube (which can add to the cost of the instrument).
There are two types of WDXRF spectrometers: simultaneous and sequential. In simultaneous WDXRF spectrometers, multiple detectors placed at different angles are used to analyze multiple elements simultaneously. In sequential WDXRF Spectrometers, the crystal is turned while elements are analyzed sequentially. Sequential WDXRF spectrometers typically have better intensity, but take longer to record measurements. WDXRF is a nondestructive technique and has applications in many industries where elemental analysis is needed, such as geoscience, environmental analysis, food safety, and analyzing archeological artifacts.
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Energy Dispersive XRF Spectrometers (EDXRF)
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Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
Item | Supermini200 High-Power Benchtop Sequential WDXRF Spectrometer | Simultix 15 Simultaneous WDXRF Spectrometer System | ZSX Primus III NEXT – High-Throughput/Affordable WDXRF Spectrometer | ZSX Primus IV Tube-above WDXRF Spectrometer | ZSX Primus IVi – High Power Sequential WDXRF Spectrometer |
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Catalog Number | Supermini200 | | ZSX Primus III NEXT | ZSX Primus IV | ZSX Primus IVi |
Price | | | | | |
Principle | Wavelength dispersive X-ray fluorescence spectroscopy (WDXRF) | Inquire | Wavelength dispersive | Wavelength Dispersive X-ray Fluorescence (WDXRF) | Inquire |
X-Ray Tube | 50 kV, 200 W Pd-anode | End window, Rh-anode, 4kw, 60 kv | End window type Rh target 3 kW | End window Rh-anode, 3kW or 4 kW | Inquire |
Goniometer Type | Inquire | Inquire | Inquire | Inquire | Inquire |
Detector(s) | Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available) | Scintillation counter (SC), Sealed proportioonal counter (S-PC), Flow proportional counter (F-PC) | SC (Scintillation counter), F-PC (Gas flow proportional counter)
Optional: S-PC LE (Gas sealed proportional counter: does not require P-10 gas) | SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator) | Inquire |
Analysis Diameter | Able to accommodate 51.5 mm diameter samples | Inquire | Inquire | 0.5, 1, 10, 20, 30 and 35 mm | Inquire |
Description | Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, for elemental analysis of oxygen (O) through uranium (U) in almost any material, the Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).
Features:
- Analyze oxygen through uranium (O -> U)
- Analyze
Solids, liquids, powders, alloys and thin films
- Atmosphere
Helium or vacuum
- X-ray tube
50 kV, 200 W Pd-anode
- Primary beam filter
Zr standard; Al optional
- Detectors
Scintillation counter and F-PC
(S-PC not requiring P10 gas optionally available)
- Crystals
3-position changer
- Sample size
Able to accommodate 51.5 mm diameter samples
- Automatic sample changer (ASC)
Standard: 10 sample positions (for 51.5 mm diameter samples)
Optional: 12 sample positions (up to 44mm diameter samples)
- Vacuum
Rotary pump standard
- Power
100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A
... Read More | For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. Nearly 1,000 Simultix For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. Nearly 1,000 Simultix XRF instruments have been delivered to customers around the world. Along with technological progress over these years, customer requirements have advanced and diversified as well. Simultix 15 WDXRF elemental analyzer was developed to meet these changing needs. It offers significantly improved performance, functions, and usability. The compact and intelligent Simultix 15 is a powerful analytical tool for elemental analysis that demonstrates superior performance across many industrial sectors.... Read More | Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability
Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability and assists with calibrations
- Attractive pricing - WDXRF performance at an affordable price
The ZSX Primus III NEXT provides rapid elemental analysis with the ability to rapidly quantify major and trace elements (Be to Cm). Its’ high-throughput, excellent sensitivity and affordable price point make it an ideal solution for industrial applications.
Tube-Above Optics
The system features Rigaku’s unique tube-above optical configuration which prevents dust and particles from contaminating optical components and distorting readings as well as minimizing maintenance and maximizing uptime. This makes it ideal for the analysis of pressed powder samples. Furthermore, using wavelength dispersive X-ray fluorescence (WDXRF) provides superior spectral resolution to energy dispersive X-ray fluorescence (EDXRF).
Improved Quality of Analytical results
The ZSX Primus III NEXT features a number of key upgrades from its predecessor resulting in improved results and high throughput levels. These include:
- The incorporation of a digital multi-channel analyzer (D-MCA) and the efficient control of each driving unit to improve the quantitative analysis throughput by 21%.
- A S-PC LE, an environmentally friendly gas-shielded proportional detector for light elements. The S-PC LE negates the need to install a detector gas cylinder
- Powerful ZSX Guidance software, common to Rigaku’s flagship WDXRF spectrometers enabling data sharing and including scheduler function to automate and streamline operations
... Read More | As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:- Analysis of elements from Be to U
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ZSX Guidance expert system software
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Digital multi-channel analyzer (D-MCA)
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EZ Analysis interface for routine measurements
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Tube above optics minimizes contamination issues
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Small footprint uses less valuable lab space
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Micro analysis to analyze samples as small as 500 µm
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30µ tube delivers superior light element performance
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Mapping feature for elemental topography/distribution
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Helium seal means the optics are always under vacuum
... Read More | Inquire |
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