VIS NIR Spectrometer

VIS-NIR spectrometers are analytical instruments used to measure and analyze light absorption and reflectance in the visible and near-infrared regions of the electromagnetic spectrum. VIS-NIR spectrometers offer rapid analysis speeds by providing a non-destructive method of analyzing samples to provide insight into their composition, structure, and various other physical properties. VIS-NIR spectrometers are used in nearly all industries and can be used to perform a multitude of analyses including concentration analysis, quality control analysis, environmental monitoring, and numerous others. When comparing VIS-NIR spectrometers be sure to compare key specifications such as wavelength range, detector type, and resolution as these can all directly impact the quality of your analysis.
CompanyMalvern PanalyticalMalvern PanalyticalMalvern Panalytical
ItemLabSpec 4 Hi-Res SpectrometersLabSpec 4 Standard-Res SpectrometersTerraSpec 4 Hi-Res Spectrometer
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Catalog NumberASD LabSpec 4 Hi-ResASD LabSpec 4 Standard-ResTerraSpec 4 Hi-Res
Price
DescriptionSuperior spectral resolution for sharp feature recognition

The ASD LabSpec 4 Hi-Res analytical spectrometer is designed for analysis of materials that are characterized by sharp spectral features that may require more resolute spectral data for accurate detection and identification.

The 3 nm VNIR, 6
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The lab analyzer for fast, non-destructive analysis to optimize your workflow

The 3 nm VNIR, 10 nm SWIR spectral resolution of the ASD LabSpec® 4 Standard-Res lab analyzer is ideal for precise spectral analysis of a wide range of materials. The 10 nm SWIR spectral resolution provides the basis for
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Fast, precise mineral exploration
Recognized as the de facto technology for mineralogical analysis, the rugged portable ASD TerraSpec mineral spectrometers are trusted by top geologists for performing fast, precise pathfinder mineral identification for identification of exploration targets. The ASD
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Wavelength Range350 to 2500 nm350 to 2500 nm350 to 2500 nm
Detector(s)VNIR detector (350-1000 nm): 512 element silicon array
SWIR 1 detector (1001-1800 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
SWIR 2 detector (1801-2500 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
VNIR detector (350-1000 nm): 512 element silicon array
SWIR 1 detector (1001-1800 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
SWIR 2 detector (1801-2500 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
VNIR detector (350-1000 nm): 512 element silicon array
SWIR 1 detector (1001-1800 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
SWIR 2 detector (1801-2500 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
Resolution3 nm @ 700 nm
6 nm @ 1400/2100 nm
3 nm @ 700 nm
10 nm @ 1400/2100 nm
3 nm @ 700 nm; 10 nm @ 1400/2100 nm
Signal-to-Noise RatioVNIR - 9,000:1 @ 700 nm
SWIR 1 - 9,000:1 @ 1400 nm
SWIR 2 - 4,000:1 @ 2100 nm
VNIR - 9,000:1 @ 700 nm
SWIR 1 - 9,000:1 @ 1400 nm
SWIR 2 - 4,000:1 @ 2100 nm
VNIR: 9,000:1 @ 700 nm
SWIR 1: 9,000:1 @ 1400 nm
SWIR 2: 4,000:1 @ 2100 nm
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