| Description | The Discovery Laser Flash DLF 2800 is an advanced freestanding instrument for the measurement of thermal diffusivity and specific heat capacity of materials from room temperature to 2800°C. The distinctive design incorporates a proprietary laser, laser optics, detector, and furnace technologies, andThe Discovery Laser Flash DLF 2800 is an advanced freestanding instrument for the measurement of thermal diffusivity and specific heat capacity of materials from room temperature to 2800°C. The distinctive design incorporates a proprietary laser, laser optics, detector, and furnace technologies, and along with the unique six-position sample carousel, ensures unprecedented measurement accuracy and sample throughput.
DLF 2800 Features:
- Powerful laser provides 40% more energy than any competitive design for the most accurate testing to the highest temperatures and widest range of samples, regardless of thickness and thermal conductivity
- Proprietary fiber optic wand delivers 99% homogeneous beam at the sample for increased measurement accuracy
- Unique six-position carousel for unmatched throughput and accurate heat capacity measurements
- Flexible carousel design configurable with a variety of sample holders, adapters and special fixtures over the widest testing range
- Advanced furnace for uncompromised temperature performance from RT to 2800°C, and measurements in inert gas or vacuum
- High sensitivity IR detector for optimum signal-to-noise ratio, delivering the highest accuracy over the entire temperature range
- Real-time pulse mapping for unmatched accuracy of thermal diffusivity measurements for testing of thin and highly conductive materials
- Meets a variety of industry standard test methods including: ASTM E1461, ASTM C714, ASTM E2585, ISO 13826, ISO 22007-Part4, ISO 18755, BS ENV 1159-2, DIN 30905
*US Patent #6.375.349.81... Read More | The Discovery Xenon Flash 200+ features a patented High Speed Xenon-Pulse Delivery™ source (HSXD) and a multi-faceted Light Pipe™. Together these optics deliver a light pulse of unsurpassed power and uniform intensity to the specimen while preventing sample holder overflash. Only TA The Discovery Xenon Flash 200+ features a patented High Speed Xenon-Pulse Delivery™ source (HSXD) and a multi-faceted Light Pipe™. Together these optics deliver a light pulse of unsurpassed power and uniform intensity to the specimen while preventing sample holder overflash. Only TA Instruments high energy Xenon design is capable of testing samples to a diameter of 25.4 mm over a temperature range from -175 °C to 900 °C. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites. The DXF platform is designed for research and development programs as well as production control.
DXF 200+ Features
- Sub-ambient temperature system with highly efficient liquid nitrogen cooling system and solid state PIN detectors for accurate and stable temperature control to an industry leading -175°C.
- Easily swappable autosampler trays can accommodate up to twelve samples 12.7 mm diameter or six 25.4 mm diameter samples, plus many more sizes and shapes.
- Software controlled PIN loading can be adjusted to maintain perfect contact regardless of sample thickness.
- Patented High Speed Xenon-Pulse-Delivery system provides 50% more energy than competitive designs for the highest degree of accuracy on widest range of samples regardless of thickness or thermal conductivity.
- Wide variety of sample trays accommodates multiple sample sizes (up to 25.4 mm), shapes, and special fixtures (liquids, powders, laminates, films, etc.) for maximum sample testing flexibility.
- Patented Light Pipe™ for the most effective collection and collimation of light and homogeneous delivery of radiation to the sample.
- Can test samples with maximum diameter of 25.4 mm diameter for easier sample preparation and handling, as well as improved results for inhomogeneous materials.
- Real-time pulse mapping for superior thermal diffusivity of thin and highly conductive materials.
- Designed to meet industry standard test methods including: ASTM E1461, ASTM C714, ASTM E2585, ISO 13826, ISO 22007-Part4, ISO 18755, BS ENV 1159-2, DIN 30905, and DIN EN821
... Read More | The FOX 50 Heat Flow Meter is an accurate, easy-to-use instrument for measuring thermal conductivity and provides rapid results in a compact footprint. The instrument is configured with the identical high performance features and proprietary technologies of the larger FOX systems including thin filmThe FOX 50 Heat Flow Meter is an accurate, easy-to-use instrument for measuring thermal conductivity and provides rapid results in a compact footprint. The instrument is configured with the identical high performance features and proprietary technologies of the larger FOX systems including thin film heat flux transducers, digital thickness measurements, responsive temperature control, plus an integrated contact-resistance correction.... Read More | The Discovery Laser Flash DLF 1200 employs a custom Class 1 Nd:Glass Laser pulse source to provide a collimated, monochromatic energy pulse with a 300 µs to 400 µs pulse width. Ideal for labs that need to measure thermal diffusivity, heat capacity or thermal conductivity at temperatures up to 1200°CThe Discovery Laser Flash DLF 1200 employs a custom Class 1 Nd:Glass Laser pulse source to provide a collimated, monochromatic energy pulse with a 300 µs to 400 µs pulse width. Ideal for labs that need to measure thermal diffusivity, heat capacity or thermal conductivity at temperatures up to 1200°C, or require the power of a laser in a compact benchtop instrument.... Read More | The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 500 produces a pulse width of 400 µs to 600 µs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.... Read More |