NEX CG II Series Indirect Excitation EDXRF Spectrometers from Rigaku Corporation

The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased signal-to-noise, even for challenging samples, making them an excellent choice for industrial quality control to advanced research applications.

NEX CG II Series are multi-purpose elemental analyzers that provide rapid qualitative and quantitative elemental analyses and address needs across many industries. They are suited to chemical analysis in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. Available models are NEX CG II, which offers excellent spectral resolution for trace peaks, and NEX CG II+, designed for more demanding applications requiring a higher-powered system.

Cartesian Geometry and Polarization for Trace Level Sensitivity

Unlike conventional energy dispersive X-ray fluorescence (EDXRF) spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II Series brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.

Key advantages and features:

• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
• Large-area high-throughput silicon drift detector (SDD)
• Analysis in air, helium, or vacuum
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
• Various automatic sample changers accommodating up to 52 mm samples
• Low cost of ownership backed by a 2-year warranty