Description
The JEM-F200 "F2" is the only advanced analytical, high throughput 200kV S/TEM in its class to offer a cold field emission gun, quad-lens condenser system, and dual large-area silicon drift detectors for high speed EDS analysis. The F2 employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical S/TEM. This multipurpose workhorse instrument yields analytical results not found in other non aberration-corrected S/TEMs.
Key Features - Quad lens condenser system
- Advanced scan system
- Pico stage drive for ultra-fast, high-precision movement of field-of-view
- SpecPorter automated sample holder transfer system
- Cold FEG with narrow energy spread
- Dual Silicon Drift Detectors
- Intuitive and efficient operation