JEM-Z200FSC CRYO ARM200 Field Emission Cryo-electron Microscope from JEOL USA, Inc.

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JEOL USA, Inc. for
JEM-Z200FSC CRYO ARM200 Field Emission Cryo-electron Microscope

Description

Cryo-electron microscopy (cryo-EM) has taken enormous flight in recent years. Atomic level structural analysis of viruses and proteins derived by cryo-EM using SPA workflows requires high stability hardware and software. JEOL proudly announces its latest offering in cryo-TEMs to facilitate this development in cryo-EM with the CRYO ARM™ 200. The CRYO ARM™ 200 achieves unprecedented resolution and stability thus allowing for the automatic and unattended acquisition of image data for Single Particle Analysis.

Key Features
  • Accelerating voltage: 200kV
  • Automated specimen exchange system
  • Cold field emission gun
  • In-column energy filter (Omega filter)
  • Automated image acquisition software for single particle analysis
  • Hole-free phase plate
  • Auto adjustment functions