JEM-3300 CRYO ARM300 II Field Emission Cryo-electron Microscope from JEOL USA, Inc.

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JEOL USA, Inc. for
JEM-3300 CRYO ARM300 II Field Emission Cryo-electron Microscope

Description

Cryo-electron microscopy (cryo-EM) has taken enormous flight in recent years. Atomic level structural analysis of viruses and proteins derived by cryo-EM using SPA workflows requires high stability hardware and software. JEOL proudly announces its latest offering in cryo-TEMs to facilitate this development in cryo-EM with the CRYO ARM™ 300. The CRYO ARM™ 300 achieves unprecedented resolution and stability thus allowing for the automatic and unattended acquisition of image data for Single Particle Analysis.

Key Features
  • High Throughput
  • Highly Flexible Operation
  • High Stability