XperRAM S from Nanobase Inc.

Product Details
ItemXperRAM S
CompanyNanobase Inc.
PriceGet Info
Spectral Range50–2240 cm?¹ at 532 nm (S-VWR); 50–1900 cm?¹ at 532 nm (S-VHR); 50–2670 cm?¹ at 1064 nm (S-NIR)
Spatial Resolution<1 µm lateral; <1 µm depth of field
Spectral Resolution2.3 cm?¹ FWHM at center (S-VWR, 532 nm); 2.0 cm?¹ FWHM (S-VHR, 532 nm); 3.6 cm?¹ FWHM (S-NIR, 1064 nm)
Scan Area200 µm × 200 µm at 40× objective
ApplicationsRaman, Photoluminescence (PL), Electroluminescence (EL), in-situ photocurrent measurement
SoftwareNanoSpectrum Software Suite; export formats: .txt, .csv (spectra), .spm, .csv (2D mapping)
Mapping Repeatability<1 µm
Microscope TypeConfocal Raman Microscope
Laser Wavelengths405, 457, 532, 633, 785, 1064 nm (up to three simultaneously)
Spectrometer Focal Length200 mm (XPE200); 400 mm (XPE400, S-VHR model)
Gratings300, 600, 1200, 1800, 2400 lpmm (S-VWR); 600, 1200, 1800, 2400 lpmm (S-VHR); 181, 300 lpmm (S-NIR)
Microscope BodyOlympus BX43 (Upright)
Scanning ModeGalvo mirror raster scan
Step Resolution100 nm
Objective40× standard (NA 0.75, WD 0.63 mm, >60% transmission 360–1000 nm); optional 10×, 20×, 50×, 100×, Long WD 40×
Fiber CouplingAvailable (fiber coupling port)
Flim SupportOptional (FLIM integration available)

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