MAHWAH, NJ, April 26, 2012 – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, introduces Hikari XP, the next generation in EBSD cameras. Hikari XP offers outstanding performance across the complete range of EBSD applications, from high speed analysis for process development and quality control to high sensitivity indexing at low beam currents and low accelerating voltages for improved spatial resolution. Providing results without compromise, the Hikari XP blends market-leading speed, sensitivity and precision in one camera. When paired with EDAX’s TEAM™ EBSD software, Hikari XP offers the highest indexing success rates on the market, guaranteeing the user the best possible data quality.
The new Hikari XP delivers high-end performance in both speed and sensitivity, encompassing all EBSD applications. In addition to the speed improvements and low beam current performance, the highly versatile Hikari XP sets the bar for precision with the capability to measure orientations with accuracy down to 0.1 degree.
“Previously, a user had to decide between a high-speed camera and a high-sensitivity camera. With the Hikari XP camera, this compromise between speed and sensitivity is no longer required,” comments Mike Coy, Technical Product Manager for Microanalysis.
“The Hikari XP not only successfully indexes 650 patterns per second at a 99% indexing rate under typical EBSD conditions but also provides outstanding sensitivity, allowing operation down to the 100 pA range of beam current while still maintaining a 99% indexing rate.”
“The ability to perform such high-precision orientation measurements allows more detailed microstructural characterization of plastic strain, sub-grain evolution and deformation mechanisms for better understanding of processing-microstructure-property relationships,” adds Coy.
Providing an unparalleled combination of speed, sensitivity and precision, the Hikari XP is the one camera for all EBSD applications. The camera is compatible with EDAX’s TEAM™ Pegasus and TEAM™ EBSD software packages, helping users solve their materials challenges quickly, easily and accurately.
EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.
Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements. EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of $3.0 billion.
For further information about EDAX, contact:
Sue Arnell EDAX
91 McKee Drive, Mahwah,
NJ 07430
Tel: (201) 529-4880
Fax: (201) 529-3156
E-mail:[email protected]
Website: www.edax.com