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Ventana Receives FDA Clearance for Estrogen Receptor (ER) Image Analysis and Digital Read Application for Breast Cancer
Monday, December 09, 2013
There are two intended uses obtained with the 510(k) clearance for ER: first, clinical use of the software algorithm to semi-quantify the ER biomarker, and second, digital read, or clearance to ... Read More
High Throughput Serial Block Face Imaging with JEOL FE SEM and Gatan 3View®
Wednesday, December 11, 2013
JEOL, Ltd., a world leader in electron microscopy, has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron ... Read More
Datacolor to Preview first-of-its-kind Color Calibration System for Microscopy
Wednesday, December 11, 2013
Datacolor®, a global leader in color management solutions, today announced ChromaCal™, a first-of-its-kind color calibration system for microscopy. The system will be previewed at the upcoming ... Read More
Bruker Launches ContourSP 3D Optical Microscope for PCB Industry
Friday, December 13, 2013
Bruker announced today that it has launched the ContourSP large panel metrology system, which more than doubles the measurement throughput of the high-density interconnect (HDI) substrates in multi-... Read More
Axio Scan.Z1 Digital Slide Scanner Acheives Optimal Image Quality
Tuesday, December 24, 2013
The Axio Scan.Z1, an automated microscope from Carl Zeiss Microscopy, allows researchers to digitalize fixed tissue sections and cytologic specimens in bright-field and fluorescence. Supporting ... Read More
Pittcon Announces Pittsburgh Conference Memorial National College Grant Awardees
Thursday, December 26, 2013
The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, a Pennsylvania non-profit corporation, is proud to announce its 2014 Pittsburgh Conference Memorial National College Grant (... Read More
Low Mass Stage from ASI
Wednesday, January 08, 2014
ASI’s MS-2000 Low Mass Stage retains the precision of our regular compact stage while providing increased thermal response times with ¾ the mass. Read More
Jenoptik with new Technologies and Products at Photonics West 2014
Friday, January 24, 2014
In San Francisco Jenoptik will be showcasing, from February 4–6, new technologies and further developments of its products from the Laser & Material Processing and Optical Systems divisions at ... Read More
FEI Launches 2014 Image Contest
Friday, January 31, 2014
FEI (NASDAQ: FEIC) today announced that the 2014 Image Contest will begin February 3, 2014. Image categories for the contest include: ‘The Natural World’, ‘The Human Body’, and ‘Around the House’. ... Read More
Linkam Reports on the Low Temperature Characterization of Nano-structures Using Temperature Controlled Microscopy at the University of Southern California
Monday, February 03, 2014
The University of Southern California first started teaching electrical engineering over a century ago and its USC Viterbi School of Engineering is ranked as one of the best in the United States. The ... Read More