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Anasys Users Publish New Peer-Reviewed Research Papers Using NanoIR.
Wednesday, August 14, 2013
There have been several recent exciting publications by nanoIR users in a number of growing applications areas. These include plasmonics, health care, fuel cell membranes and polymer nanostructures. ... Read More
Nexview(TM) 3D Imaging and Surface Metrology System With High Precision, Flexibility and Speed Introduced by Zygo
Monday, September 02, 2013
The Nexview profiler is optimized for non-contact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough. With sub-nanometer vertical resolution at ... Read More
Bruker Introduces New LumiMap Electroluminescence Tool for Optical and Electrical Characterization on Epi Wafers for HB-LEDs
Wednesday, September 11, 2013
“LumiMap provides more accurate and reliable electrical and optical epi wafer measurements than the traditional indium dot method,” said Dr. Ryan Lee, Executive VP and CTO of Foshan Nationstar ... Read More
Bruker Announces Acquisition of Prairie Technologies
Monday, September 16, 2013
Headquartered near Madison, Wisconsin, privately-held Prairie pioneered the use of multiphoton fluorescence microscopy. Its industry-leading multiphoton product offerings have enabled researchers to ... Read More
JPK Reports on the Study of Structure and Dynamics of Biological Membranes Using AFM and Advanced Fluorescence Microscopies in Pierre-Emmanuel Milhiet's Group at the CBS in Montpellier
Thursday, October 17, 2013
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on how AFM and advanced fluorescence microscopy is being applied in... Read More
Anasys' EPFL Users Publish their AFM-IR Application of Research into Photosynthesis
Wednesday, October 23, 2013
École Polytechnique Federale de Lausanne, better known as EPFL, has recently reported on how a group of its scientists have used powerful imaging techniques including nanoIR to support a study which ... Read More
Bruker Introduces Dektak XTL to Address Semiconductor Needs
Friday, January 17, 2014
Bruker (NASDAQ: BRKR) today announced the release of the Dektak XTL Stylus Profiler, extending its industry-leading stylus profilometry capabilities to 200 and 300 millimeter semiconductor wafer fabs... Read More
Jenoptik with new Technologies and Products at Photonics West 2014
Friday, January 24, 2014
In San Francisco Jenoptik will be showcasing, from February 4–6, new technologies and further developments of its products from the Laser & Material Processing and Optical Systems divisions at ... Read More
University of Texas, Austin, Researchers Publish Resonance Enhanced AFM-IR Analysis With Monolayer Sensitivity
Wednesday, February 12, 2014
Anasys Instruments reports on the publication in Nature Photonics from Prof. Belkin (The University of Texas at Austin) demonstrating the use of resonance-enhanced AFM-IR with unprecedented ... Read More
AFM-IR Used by French Researchers to Identify Best Microbes for Biofuel Production
Wednesday, February 19, 2014
Anasys Instruments reports on the publication in the Journal of Physical Chemistry Letters demonstrating the use of AFM-IR used by French researchers to identify best microbes for biofuel production. Read More

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Anasys Users Publish New Peer-Reviewed Research Papers Using NanoIR.

Nexview(TM) 3D Imaging and Surface Metrology System With High Precision, Flexibility and Speed Introduced by Zygo

Bruker Introduces New LumiMap Electroluminescence Tool for Optical and Electrical Characterization on Epi Wafers for HB-LEDs

Bruker Announces Acquisition of Prairie Technologies

JPK Reports on the Study of Structure and Dynamics of Biological Membranes Using AFM and Advanced Fluorescence Microscopies in Pierre-Emmanuel Milhiet's Group at the CBS in Montpellier

Anasys' EPFL Users Publish their AFM-IR Application of Research into Photosynthesis

Bruker Introduces Dektak XTL to Address Semiconductor Needs

Jenoptik with new Technologies and Products at Photonics West 2014

University of Texas, Austin, Researchers Publish Resonance Enhanced AFM-IR Analysis With Monolayer Sensitivity

AFM-IR Used by French Researchers to Identify Best Microbes for Biofuel Production

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