SEM Sample Preparation / TEM Sample Preparation

SEM Sample Preparation / TEM Sample Preparation SEM and TEM sample preparation equipment are essential tools used to prepare specimens for scanning electron microscopy (SEM) and transmission electron microscopy (TEM) analysis. These instruments—such as sputter coaters, ion mills, ultramicrotomes, and plasma cleaners—ensure samples are properly thinned, cleaned, and coated for optimal imaging resolution and contrast. Choosing the right preparation tools depends on your sample type, required thickness, conductivity, and imaging goals. High-quality SEM/TEM prep equipment improves imaging accuracy, prevents artifacts, and is critical for advanced materials characterization and nanostructure analysis.

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Cross Section Polisher
JEOL USA, Inc.
  • Type:
    Cross Section Polisher
  • Applications:
    Electron microscopy sample prep
DII-29020HD (HD Treatment)
JEOL USA, Inc.
  • Type:
    Hydrophilization Treatment Device
  • Applications:
    Dedicated hydrophilization treatment device that has been designed to facilitate the preparation of samples for electron microscopy.
EC-32010CC JEOL Carbon Coater
JEOL USA, Inc.
  • Type:
    Carbon Coater
  • Applications:
    A sample preparation device that evaporates carbon to create a conductive thin film on the sample surface.
EC-52000IC (Ion Cleaner)
JEOL USA, Inc.
  • Type:
    ION CLEANER
  • Applications:
    Holds a specimen of an electron microscope underglow discharge, for removing hydrocarboncontaminants adhered to the specimen byutilizing physical and chemical reactions.
Excimer UV Cleaner SM-92100EUVC
JEOL USA, Inc.
  • Type:
    UV CLEANER
  • Applications:
    Mitigates Contamination during Observations Made with an Electron Microscope
IB-29510VET Vacuum Evaporator
JEOL USA, Inc.
  • Type:
    Vacuum Evaporator
  • Applications:
    Facilitates specimen preparation for electron microscopes
JEC-3000FC (Auto Fine Coater)
JEOL USA, Inc.
  • Type:
    Sputter Coater
  • Applications:
    Fully automated sputter coating for SEM imaging
JII-29080DMS (Sample Holder Pre-exhaust System)
JEOL USA, Inc.
  • Type:
    Inquire
  • Applications:
    Holder station that holds a transmission electron microscope (TEM) sample holder in a vacuum.
miXcroscopy™ Linked Optical & Scanning Electron Microscopy System
JEOL USA, Inc.
  • Type:
    Linked Optical & Scanning Electron Microscopy System
  • Applications:
    Inquire
Smart Coater
JEOL USA, Inc.
  • Type:
    Sputter Coater
  • Applications:
    Fully automated sputter coating for imaging in a scanning electron microscope
Select up to 5 products from above to compare or request more information.

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  • JEOL USA, Inc.

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