Inductively Coupled Plasma Mass Spectrometer (ICP MS)

Inductively coupled plasma mass spectrometers (ICP-MS) utilize inductively coupled plasma for sample ionization and an MS for ion separation and quantification. The low detection limits and high productivity possible with ICP-MS are particularly useful for trace metal analysis and environmental testing. Common components of an ICP-MS system include a sample introduction system, an ion source, a vacuum system, a collision reaction cell, ion optics, a mass spectrometer (often a quadrupole), and a detector. An analytical working range of nine orders of magnitude, detection limits below the ppt range, and aptitude for isotopic analysis are hallmarks of ICP-MS. ICP-MS instruments are commonly configured for routine analyses, high-matrix interference samples, or specific applications, such as work in the semiconductor industry or medical and forensic toxicology fields. Also, be sure to consider any desired customization options, such as chromatographic coupling or use with organic solvents.

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CompanyNu InstrumentsNu Instruments
ItemVitesse ICP-MSAttom ES ICP-MS
Price
DescriptionThe Vitesse is a Time-of-Flight (TOF) ICP-MS designed for simultaneous full-spectrum acquisition at acquisition rates of 33 kHz (full mass range) up to 160 kHz (reduced mass range via over-pulsing). It incorporates a segmented hexapole reaction cell for interference removal and a patented physical ... Read MoreThe Attom ES is a double-focusing, single-collector HR-ICP-MS with the analyser and sample introduction system at ground potential. It uses a laminated magnet with FastScan electrostatic deflector optics to cover up to 40% of a given mass range without changing the magnetic field. A unique patented ... Read More
Optical SystemTime-of-Flight (TOF) mass spectrometer with segmented hexapole reaction cell; Bradbury-Nielsen gate for mass range selection; optional full-sized quadrupole pre-cell (QCT option); patented ion beam attenuatorDouble-focusing magnetic sector (electrostatic analyser + laminated magnet); forward Nier-Johnson geometry; ground-potential analyser; FastScan electrostatic deflector optics covering up to 40% of mass range; three fixed-slit resolution modes: low (~300 M/?M), medium (~4,000 M/?M), high (>10,000 M/?M)
Mass AnalyzerTime-of-Flight (TOF); simultaneous full-spectrum acquisition; acquisition rate 33 kHz (full mass range) to 160 kHz (reduced mass range); spectrum readout time as low as 80 µsSingle-collector double-focusing magnetic sector; mass range 1–260 u
Dynamic Range10 orders of magnitude (patented ion beam attenuation system combined with MagneTOF detector)9 orders of magnitude (pulse-counting multiplier with patented beam attenuation); 12 orders of magnitude with optional Faraday detector
ApplicationsLaser ablation elemental imaging, nanoparticle analysis, single-cell analysis, single-particle ICP-MS, nuclear forensics, geochemistry, environmental monitoringLaser ablation imaging, nanoparticle analysis, isotope ratio measurements, trace element quantification, nuclear analysis, geochemistry, environmental monitoring
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