Inductively Coupled Plasma Mass Spectrometer (ICP MS)

Inductively coupled plasma mass spectrometers (ICP-MS) utilize inductively coupled plasma for sample ionization and an MS for ion separation and quantification. The low detection limits and high productivity possible with ICP-MS are particularly useful for trace metal analysis and environmental testing. Common components of an ICP-MS system include a sample introduction system, an ion source, a vacuum system, a collision reaction cell, ion optics, a mass spectrometer (often a quadrupole), and a detector. An analytical working range of nine orders of magnitude, detection limits below the ppt range, and aptitude for isotopic analysis are hallmarks of ICP-MS. ICP-MS instruments are commonly configured for routine analyses, high-matrix interference samples, or specific applications, such as work in the semiconductor industry or medical and forensic toxicology fields. Also, be sure to consider any desired customization options, such as chromatographic coupling or use with organic solvents.

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CompanyNu InstrumentsNu Instruments
ItemNu Sapphire XD MC-ICP-MS/MSPlasma 3 MC-ICP-MS
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DescriptionSapphire XD is a dual-path MC-ICP-MS/MS that extends the Sapphire platform with a fully retractable Double Wien mass filter (permanent magnets + lens field arrays) and an Xtra Dispersion (XD) fixed collector array. The mass filter can be inserted prior to the hexapole collision/reaction cell for MS/... Read MorePlasma 3 is a third-generation MC-ICP-MS using a double-focusing forward Nier-Johnson geometry (electrostatic analyser followed by laminated magnet) at ground potential. It features a variable-dispersion Zoom Optics system for instantaneous switching between collector configurations and supports ... Read More
Optical SystemDouble-focusing magnetic sector; dual-path transfer optics (high-energy path and low-energy path with hexapole CRC); fully retractable Double Wien mass filter (permanent magnets + lens field arrays); variable-dispersion Zoom Optics; Enhanced Sensitivity Interface as standard; up to 4 mass-flow-controlled reaction gas inlets; software-selectable standard, medium, and high-resolution modesDouble-focusing forward Nier-Johnson geometry (electrostatic analyser + laminated magnet); ground-potential analyser; variable-dispersion Zoom Optics; Enhanced Sensitivity Interface (ES) as standard; optional Enhanced Abundance Transfer Optics (EATO, UK Patent GB 2545670); abundance sensitivity <2 ppm at –1 amu relative to 238U (standard deceleration filter), <0.5 ppm post-filter, <1 ppm with EATO pre-filter, <0.05 ppm with EATO post-filter
Mass AnalyzerMulti-collector double-focusing magnetic sector with MS/MS capability; XD collector array with up to 28 Faraday cups + up to 6 ion-counting detectors (SEM or Daly); mass range Li to U and beyond; 25% natural dispersion; dynamic range 0–75 Gcps (SEM to 10^10 O pre-amplifier)Multi-collector double-focusing magnetic sector; 16 Faraday cups + up to 6 ion-counting detectors (SEM or Daly); mass range lithium to actinide series
Dynamic Range0–75 Gcps (0–1200 V) from SEM to 10^10 O resistor pre-amplifierInquire
ApplicationsGeochronology (Rb-Sr, Lu-Hf, Re-Os, U-Th-Pb), stable isotope analysis (Mg, Si, S, K, Ca, Ti, V, Cr, Fe, Ni, Se), laser ablation in situ dating, nuclear safeguarding, environmental monitoring, forensics, life sciencesEarth sciences, geochronology, geochemistry, environmental science, nuclear research, archaeology, forensics, biochemistry, biomedical science
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