| Description | Features - High-sensitivity, low-noise 19 M pixel CMOS sensor enables clearer imaging with fine specimen details observable even at low electron doses.
- Its global shutter and high frame rate (58 fps/full pixel mode) enable image series acquisitions with less artifacts during dynamic observation.
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Features - High-sensitivity, low-noise 19 M pixel CMOS sensor enables clearer imaging with fine specimen details observable even at low electron doses.
- Its global shutter and high frame rate (58 fps/full pixel mode) enable image series acquisitions with less artifacts during dynamic observation.
- "SightX" camera system control software provides user-friendly operations.
... Read More | JEOL, currently the largest EDX detector manufacturer in the industry, has developed a number of Silicon Drift Detectors (SDD) for various applications ranging from 60mm 2 to 158mm 2. JEOL SDD detectors deliver unparalleled EDX analytical results for a wide range of materials, offering solid angles JEOL, currently the largest EDX detector manufacturer in the industry, has developed a number of Silicon Drift Detectors (SDD) for various applications ranging from 60mm 2 to 158mm 2. JEOL SDD detectors deliver unparalleled EDX analytical results for a wide range of materials, offering solid angles as high or greater than 2.2sr depending upon the TEM/STEM configuration.
Utilizing JEOL’s unique, on-the-fly “Lossless Drift Compensation”, large pixel EDX maps can be generated at up to atomic resolution, even for beam sensitive or 2D materials, at various accelerating voltages. In addition, JEOL’s spectrum imaging saves not only the entire spectrum data set but also each individual spectral slice, allowing for the specific summing of any number of frames collected during an experiment, which is useful for in-situ experiments.
The addition of the JEOL/IDES EMD Synchrony 50ns electrostatic beam blanker offers control of the electron dose at each individual pixel while cutting the “flyback” weighted issues that all other EDS systems are known to have. Quantitative analytical results are generated utilizing either K-Factors or ?-Zeta factors, providing as accurate Quant results as possible for your sample. Contact a JEOL representative for a live demo or sample run on your materials to see what results JEOL can generate to better understand your materials.... Read More | Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into a Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into a useful tool that anyone can use easily, from operation to maintenance.... Read More | The high-strength SiN film enables us to observe a serially large area of a millimeter in size. It is also ideal for observation of serially sliced sections because there is no invisible area that is caused by conventional TEM grids. The dedicated retainer makes it easy to perform Correlative Light The high-strength SiN film enables us to observe a serially large area of a millimeter in size. It is also ideal for observation of serially sliced sections because there is no invisible area that is caused by conventional TEM grids. The dedicated retainer makes it easy to perform Correlative Light and Electron Microscopy (CLEM).
To use CLEM retainer (SiN Window Chip starter kit), the EM-21010 common specimen holder and SiN Window Chips (20 chips / case) are required separately.... Read More |