Spectrophotometers are used to measure the concentration of a known substance in a solution. They do this by passing a light through the substance and measuring light intensity as a function of wavelength. Either single beam or double beam spectrophotometers can be purchased. In a single beam spectrophotometer, a reference standard is used to measure light intensity before and after the sample is loaded. For double beam spectrophotometers the beam is split with one beam passing through the standard and the other through the sample to compare intensities. While single beam spectrophotometers are typically less expensive and have higher sensitivity, double beam spectrophotometers tend to be more stable and easier to use. Spectrophotometers are important pieces of equipment in chemistry, physics, biochemistry, clinical, and materials testing labs.
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| Company | Agilent Technologies | Agilent Technologies |
| Item | Cary 6000i UV-Vis-NIR Spectrophotometer | Cary 7000 Universal Measurement Spectrophotometer (UMS) |
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| Reviews | | |
| Catalog Number | 10079400 | Cary 7000 |
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| Type | UV-VIS-NIR | Universal measurement spectrophotometer |
| Wavelength Range | 175 to 1800 nm | 175 to 3300 nm |
| Wavelength Accuracy | UV/vis +/- 0.1, NIR +/- 0.2 | UV-vis ± 0.08 nm,NIR ± 0.4 nm |
| Scanning Speed | UV-Vis 2,000 nm/min; NIR 8,000 nm/min | UV-Vis 2000 nm/min, NIR 8000 nm/min |
| Spectral Bandwidth | UV-Vis 0.01 - 5.00 nm; NIR 0.04 - 20 nm | UV-Vis 0.01 to 5.00 nm; NIR 0.04 to 20 nm |
| Optical System | Double out-of-plane Littrow monochromator | Double out-of-plane Littrow monochromator |
| Light Source | Mercury lamp | Tungsten halogen visible and deuterium arc UV |
| Resolution | UV/Vis less than 0.05; NIR less than 0.1 | Inquire |
| Description | The Cary 6000i UV-Vis-NIR spectrophotometer has been tailored for unmatched photometric performance in the short-wave infrared (SWIR) 800–1800 nm range as well as the UV-visible 175 to 800 nm. Using narrow-band InGaAs detection and a 600 lines-per-mm diffaction grating for improved SWIR sensivity, The Cary 6000i UV-Vis-NIR spectrophotometer has been tailored for unmatched photometric performance in the short-wave infrared (SWIR) 800–1800 nm range as well as the UV-visible 175 to 800 nm. Using narrow-band InGaAs detection and a 600 lines-per-mm diffaction grating for improved SWIR sensivity, the Cary 6000i is the ultimate tool for materials characterization spectroscopy.
Using Cary WinUV software with the Cary 6000i makes it easy to perform powerful analysis and control optional accessories. The large sample compartment can be expanded to hold large accessories and integrating spheres for spectral and diffuse reflectance. The LockDown mechanism makes it possible to quickly change and position accessories for reproducible results.
Features
- Measure beyond 8.0 absorbance units with reference beam attenuation
- Measure 175 to 1800 nm using a narrow-band InGaAs detector and 600 l/mm NIR diffraction gratings for unmatched sensivity in the short-wave infrared
- WinUV software—modular software with power analysis and enhanced transfer and report export capabilities
- Versatile set of accessories for materials research including spectral and diffuse reflectance
- Variable slit widths (down to 0.01 nm) for optimum control over data resolution
- Large sample compartment with LockDown mechanism for quick changes and positioning for reproducible results
- Maximum light throughput using Schwarzchild coupling optics for higher accuracy at low transmission levels
- Minimal noise and stray light using a floating aluminum casting and double out-of-plane Littrow monochromator
- Extended dynamic range by attenuating the reference beam to balance double beam signal levels.
- Nitrogen purging—separate purging in the sample and monochromator compartments to reduce oxygen and water vapor in the ultra-violet.
... Read More | The Agilent Cary 7000 universal measurement spectrophotometer (UMS) will satisfy all your solid sampling needs. Collect hundreds of UV-Vis-NIR spectra overnight or characterize optical components and thin films in minutes to hours rather than hours to days. The Cary 7000 UMS is a turn-key solution The Agilent Cary 7000 universal measurement spectrophotometer (UMS) will satisfy all your solid sampling needs. Collect hundreds of UV-Vis-NIR spectra overnight or characterize optical components and thin films in minutes to hours rather than hours to days. The Cary 7000 UMS is a turn-key solution for research, development, and QA/QC in optics, thin films/coatings, solar, and glass.
The Cary 7000 instrument's multiangle specular reflectance and transmittance capabilities allow you to design experiments never before possible—expanding your research—while the automated reflectance and transmission will save you time and money.
Features
- Achieve complete sample characterization
- Measure absolute reflection and transmission in a single sequence—at variable angle and s or p polarization—without moving or disturbing the sample.
- Measure diffusely scattered transmission and reflection with the freedom to control detector and sample position independently
- Utilize the huge sample chamber to accommodate all sample types—from small to large—delivering 360 degrees of rotational flexibility
- Obtain complete control of beam collimation and patch size to best suit your sample and measurement needs
- Lower your cost-per-analysis, saving you time and money
- Measure in minutes what other systems take hours to days to complete—with unattended automation
- Simply set up your method, collect a single baseline, insert one or more samples, and walk away
- New insights into advanced materials with an unprecedented 10 Abs range
- With 10 Abs range on the Cary 7000 spectrophotometer, the Cary 7000 UMS ensures you obtain high quality results even with challenging sample measurements, such as high optical density (OD) or under difficult measurement conditions
- Obtain the highest quality results fast with the next generation Cary WinUV software
- The Cary WinUV software features a new method editor for simple method setup, advanced data processing, and 3D graphics, ensuring fast and accurate data analysis
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| Quantity | EA | EA |
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