X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Malvern Panalytical | Malvern Panalytical |
| Item | Aeris Research Benchtop X-Ray Diffractometer | Empyrean XAS |
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| Catalog Number | Aeris Research | Empyrean XAS |
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| X-Ray Tube | Empyrean X-ray tube, Cu | Inquire |
| X-Ray Generator | Wavelengths: Cu or Co, Tube setting: From 300 W to 600 W options in 30 kV or 40 kV setting | Inquire |
| Goniometer Type | DOPS2 goniometer with Heidenhain encoders | Inquire |
| Detector(s) | PIXcel 1D Detector; PIXcel3D Detector | 1Der Advanced detector |
| Description | Prepare to be surprised by our highly accurate, fast XRD system: Aeris. Precise results can be ready in less than five minutes – allowing you to push the scientific frontier. The compact Aeris is small, powerful, and the first of its kind. This compact instrument is smaller and easier to use Prepare to be surprised by our highly accurate, fast XRD system: Aeris. Precise results can be ready in less than five minutes – allowing you to push the scientific frontier. The compact Aeris is small, powerful, and the first of its kind. This compact instrument is smaller and easier to use than floorstanding equipment and bigger and more powerful than benchtop systems. Aeris is just right. It delivers the precision, robustness, and efficiency that our customers know and love – providing outstanding quality with all the convenience of a smaller footprint. Take the one-step sample loading in combination with its controlled user access and the option to design data collection programs offline, the result is a practical and versatile system for all users, from beginners to experts. Features: - It is intuitive - Place your sample, choose a measurement program, receive your results
- It has best-in-class performance - Superior resolution and linearity for accurate and reliable phase analysis
- It is the ideal teaching tool - With the optional 2D detector you can teach the fundamentals of powder diffraction in a visual manner
- It can measure phase transitions - With the optional non-ambient chamber you can see how the phase composition changes with temperature
Product Detail - Item: Aeris Research Compact X-Ray Diffractometer
... Read More | Empyrean XAS brings laboratory-based XANES and EXAFS measurements to the X-ray diffraction (XRD), X-ray scattering, and imaging techniques of the Empyrean platform.
By enabling multiple structural techniques on a single instrument, Empyrean connects long-range structure, nanoscale organization, Empyrean XAS brings laboratory-based XANES and EXAFS measurements to the X-ray diffraction (XRD), X-ray scattering, and imaging techniques of the Empyrean platform.
By enabling multiple structural techniques on a single instrument, Empyrean connects long-range structure, nanoscale organization, and local chemical environments within one consistent workflow.
Key highlights of the Empyrean XAS:
- Reveal oxidation state, local structure, and chemical state information beyond average crystallographic structure.
- Perform routine XANES and EXAFS measurements without competing for synchrotron beamtime.
- Combine XAS, XRD, scattering, PDF, and imaging on a single Empyrean platform.
- Generate synchrotron-comparable data with excellent agreement to reference synchrotron measurements.
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