X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | MiniFlex Benchtop X-ray Diffractometer | DicifferX WAXS Edition | DicifferX WAXS Edition High-speed wide-angle X-ray Scattering System | Rigaku XtaLAB Synergy Flow Automated Single Crystal XRD | XtaLAB Synergy-S Single or Dual Microfocus X-ray Diffractometer |
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| Catalog Number | MiniFlex | | DicifferX WAXS | | XtaLAB Synergy-S |
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| X-Ray Tube | Inquire | Inquire | 1.2 kW micro source rotating anode X-ray generator | Inquire | Inquire |
| X-Ray Generator | Cu, Co, Fe, or Cr, 40 kV, 15 mA | High-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam) | Inquire | Inquire | Inquire |
| Goniometer Type | Vertical, Theta or 2Theta | No goniometer (open stage design) | WAXS camera | Intelligent Goniometer Head (IGH) with motorized automation; automated sample centering in as little as 6 seconds | Inquire |
| Detector(s) | D/teX, Ultra 1D High speed silicon strip detector | HyPix-6000 2D HPAD on motorized 2-axis stage | High-energy resolution 2D hybrid pixel array detector (HyPix) | Direct X-ray detection detectors (varies by Synergy base model selected) | Inquire |
| Description | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | Inquire | Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and
Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and humidity conditions
DicifferX WAXS Edition redefines what’s possible for in-house WAXS measurements.
By delivering structural insights in seconds, it accelerates decision-making and drives rapid innovation.
Studies once requiring long measurement times or external facilities can now be performed directly in your
own laboratory, streamlining workflows and empowering faster materials development.... Read More | Inquire | With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces fast, precise data in an intelligent fashion.
The system is based around the PhotonJet-S series of microfocus X-ray sources that incorporate continuously variable divergence slits. These third generation sources have been designed to maximize X-ray photons at the sample by using a combination of new optics, new, longer life, tubes and an improved alignment system. PhotonJets are available in Cu, Mo or Ag wavelengths in either a single or dual source configuration.
The XtaLAB Synergy-S single crystal X-ray diffractometer comes with kappa goniometer that incorporates fast motor speeds and a unique telescopic two-theta arm to provide total flexibility for your diffraction experiment. The system is also equipped with your choice of HPC X-ray detector, including the HyPix-6000HE, PILATUS3 R 200K, PILATUS3 R 300K or EIGER 1M.
Features: - Thigh source flux and increased goniometer speed to allow quicker, more agile experiments
- Unique telescopic two-theta arm to reach both longer and shorter crystal-to-detector distances
- Enhanced kappa goniometer design with symmetrical 2? positioning
- Improved X-ray optic alignment mechanism for easy maintenance
- User-inspired cabinet design for improved workflow
- New electronically controlled brightness of cabinet and crystal lighting
- Extremely high performance due to bright source, noise-free X-ray detector and fast goniometer speeds
- Continuously variable divergence slits lets you resolve reflections from long unit cells
- Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting
- Compact design to fit in your laboratory
... Read More |
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