X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | DicifferX WAXS Edition High-speed wide-angle X-ray Scattering System | AutoMATE II | MiniFlex Benchtop X-ray Diffractometer | Rigaku XtaLAB Synergy Flow Automated Single Crystal XRD | XtaLAB Synergy-i Single Crystal X-ray Diffractometer |
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| Catalog Number | DicifferX WAXS | AutoMATE II | MiniFlex | | XtaLAB Synergy-i |
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| X-Ray Tube | 1.2 kW micro source rotating anode X-ray generator | Cr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type | Inquire | Inquire | Inquire |
| X-Ray Generator | Inquire | 3 kW sealed X-ray tube | Cu, Co, Fe, or Cr, 40 kV, 15 mA | Inquire | Inquire |
| Goniometer Type | WAXS camera | two-axis goniometer | Vertical, Theta or 2Theta | Intelligent Goniometer Head (IGH) with motorized automation; automated sample centering in as little as 6 seconds | Inquire |
| Detector(s) | High-energy resolution 2D hybrid pixel array detector (HyPix) | D/teX Ultra 1000 | D/teX, Ultra 1D High speed silicon strip detector | Direct X-ray detection detectors (varies by Synergy base model selected) | HyPix-Bantam |
| Description | Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and
Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and humidity conditions
DicifferX WAXS Edition redefines what’s possible for in-house WAXS measurements.
By delivering structural insights in seconds, it accelerates decision-making and drives rapid innovation.
Studies once requiring long measurement times or external facilities can now be performed directly in your
own laboratory, streamlining workflows and empowering faster materials development.... Read More | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features: - Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | Inquire | The XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i containsThe XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i contains the latest technology and can be upgraded from a single source to a dual source instrument. The system can be equipped with Cu and/or Mo sources allowing for a broad range of sample types to be evaluated. The XtaLAB Synergy-i is controlled by the fully-integrated, user-inspired CrysAlisPro software package that is capable of collecting and processing data efficiently and accurately, so you achieve the best data possible.
The XtaLAB Synergy-i is a full-featured single crystal X-ray diffractometer that requires little servicing to maximize uptime and throughput. It is the ideal diffractometer for crystallography research laboratories.
Features: - Up to 50 W microfocus X-ray tube with multilayer optics
- High precision 4-circle kappa goniometer
- State-of-the-art HPC technology detector, the HyPix-Bantam
- New cabinet design with controlled sample and cabinet lighting
- The system conforms to the most stringent of X-ray safety guidelines
- CrysAlisPro: Powerful, user-friendly software, comes standard with AutoChem3.0 for fully-automated structure solution and refinement
- Simple dual-source upgrade
... Read More |
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