X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
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| Company | Malvern Panalytical | Malvern Panalytical |
| Item | X'Pert3 MRD XL Materials Research X-ray Diffraction System | Aeris Research Benchtop X-Ray Diffractometer |
| Citations | | |
| Catalog Number | X'Pert3 MRD XL | Aeris Research |
| Price | | |
| X-Ray Tube | Empyrean X-ray tube, choice of anodes: Cu, Co, Cr, Mo, Ag | Empyrean X-ray tube, Cu |
| X-Ray Generator | 3 kW generator supporting all current and future X-ray tubes | Wavelengths: Cu or Co, Tube setting: From 300 W to 600 W options in 30 kV or 40 kV setting |
| Goniometer Type | High resolution, with Heidenhain encoders | DOPS2 goniometer with Heidenhain encoders |
| Detector(s) | PIXcel3D 3D Detection System, X'Celerator, Xenon Proportional Detector | PIXcel 1D Detector; PIXcel3D Detector |
| Description | The X’Pert3 MRD-XL Materials Research Diffractometer is the system of choice for high resolution diffraction and scattering analysis of wafers up to 300mm in diameter. It handles a wide variety of X-ray scattering methods, including high resolution diffraction, in-plane diffraction, reflectivity, The X’Pert3 MRD-XL Materials Research Diffractometer is the system of choice for high resolution diffraction and scattering analysis of wafers up to 300mm in diameter. It handles a wide variety of X-ray scattering methods, including high resolution diffraction, in-plane diffraction, reflectivity, thin film phase analysis, wafer mapping, GISAXS, stress, texture and nonambient analysis. The X’Pert3 MRD features the highest resolution goniometer with Heidenhain encoders for lightening fast positioning, a 5 axis cradle allowing for support and mapping of wafers up to 6 inches in diameter, and a wide variety of advanced optics and detectors, including the PIXcel3D for fast reciprocal space mapping. The X’Pert3 MRD-XL also offers a sophisticated, automatic wafer loader option that enables the X'Pert3 MRD XL to function as an 'in-wall' system, with the wafer being loaded from a clean room environment and placed on to a self-centered wafer holder.... Read More | Prepare to be surprised by our highly accurate, fast XRD system: Aeris. Precise results can be ready in less than five minutes – allowing you to push the scientific frontier. The compact Aeris is small, powerful, and the first of its kind. This compact instrument is smaller and easier to use Prepare to be surprised by our highly accurate, fast XRD system: Aeris. Precise results can be ready in less than five minutes – allowing you to push the scientific frontier. The compact Aeris is small, powerful, and the first of its kind. This compact instrument is smaller and easier to use than floorstanding equipment and bigger and more powerful than benchtop systems. Aeris is just right. It delivers the precision, robustness, and efficiency that our customers know and love – providing outstanding quality with all the convenience of a smaller footprint. Take the one-step sample loading in combination with its controlled user access and the option to design data collection programs offline, the result is a practical and versatile system for all users, from beginners to experts.
Features: - It is intuitive - Place your sample, choose a measurement program, receive your results
- It has best-in-class performance - Superior resolution and linearity for accurate and reliable phase analysis
- It is the ideal teaching tool - With the optional 2D detector you can teach the fundamentals of powder diffraction in a visual manner
- It can measure phase transitions - With the optional non-ambient chamber you can see how the phase composition changes with temperature
Product Detail - Item: Aeris Research Compact X-Ray Diffractometer
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