X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemXtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography SystemAutoMATE IILabLinc Studio Modular Integration platform for Autonomous LabsMiniFlex Benchtop X-ray DiffractometerSmartLab SE X-ray Diffractometer
Citations
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Catalog NumberXtaLAB mini IIAutoMATE IILabLinc StudioMiniFlexSmartLab SE
Price
X-Ray Tubestandard X-ray tubesCr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short typeInquireInquire3 kW sealed X-ray tube
X-Ray GeneratorStandard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometer3 kW sealed X-ray tubeInquireCu, Co, Fe, or Cr, 40 kV, 15 mAInquire
Goniometer TypeRugged two-axis goniometer with fixed detectortwo-axis goniometerInquireVertical, Theta or 2ThetaInquire
Detector(s)HyPix-Bantam two-dimensional semiconductor X-ray detectorD/teX Ultra 1000InquireD/teX, Ultra 1D High speed silicon strip detectorHyPix-400 2D, D/teX Ultra 250 1D
DescriptionBenchtop small molecule structure determination

The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II
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The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.

The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and
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LabLinc Studio is Rigaku’s modular integration offering for autonomous labs, combining RAI (Rigaku Automation Interface), SmartLab software workflow packaging, and optional automation hardware (sample handling, robots, robot-compatible doors/enclosures) plus technical support. Critical instrument ... Read MoreNew sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreThe SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross ... Read More
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