| Sample Type | Oils, liquids, solids, metals, polymers, powders, pastes, coatings, and thin films | Oils, liquids, solids, metals, polymers, powders, pastes, coatings, and thin films | Inquire |
| Description | The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased signal-to-noise, even for challenging samples, making them an excellent choice for industrial quality control to advanced research applications.
NEX CG II Series are multi-purpose elemental analyzers that provide rapid qualitative and quantitative elemental analyses and address needs across many industries. They are suited to chemical analysis in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. Available models are NEX CG II, which offers excellent spectral resolution for trace peaks, and NEX CG II+, designed for more demanding applications requiring a higher-powered system.
Cartesian Geometry and Polarization for Trace Level Sensitivity
Unlike conventional energy dispersive X-ray fluorescence (EDXRF) spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II Series brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.
Key advantages and features:
- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
- Indirect excitation for exceptionally low detection limits
- High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
- Large-area high-throughput silicon drift detector (SDD)
- Analysis in air, helium, or vacuum
- Powerful and easy-to-use QuantEZ software with multilingual user interface
- Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
- Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
- Various automatic sample changers accommodating up to 52 mm samples
- Low cost of ownership backed by a 2-year warranty
... Read More | The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers that provide rapid, non-destructive qualitative and quantitative elemental analysis of sodium (Na) to uranium (U) with small spot analysis capabilities. NEX DE Series analyzersThe Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers that provide rapid, non-destructive qualitative and quantitative elemental analysis of sodium (Na) to uranium (U) with small spot analysis capabilities. NEX DE Series analyzers serve a broad range of applications and industries and are ideal for measuring low ppm levels up to high weight percent concentrations. They are well-suited for exploration, research, bulk RoHS inspection, education, forensics, and industrial and production monitoring applications.
NEX DE Series spectrometers deliver high-performance results when analysis time or sample throughput is critical. They have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-performance silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates provide low limits of detection and excellent spectral resolution, and high-throughput measurements are obtained with various interchangeable automatic sample changers. These features enable the NEX DE Series to deliver the highest precision analytical results in the shortest possible measurement times. Additionally, NEX DE Series feature QuantEZ software designed to maximize time for its users. The intuitive instrument control, simple menu navigation, and EZ Analysis interface simplify routine operations and allow operators to create new applications using a simple flow bar wizard.
For small spot analysis needs, the NEX DE VS model features a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes. The instrument’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, and the Point Analysis interface and integrated backlit camera allow easy sample positioning for small spot measurements. NEX DE VS is an excellent system for measuring coatings on smaller parts, screening small samples for electronic waste initiatives, or investigating the identification of foreign matter of unknown composition.
Whether on the plant floor or in a QC lab, the NEX DE Series analyzers provide unparalleled performance for bulk and small-spot analysis. The superior analytical power, flexibility, and ease of use add to their broad appeal for an ever-expanding range of applications, including basic quality control (QC) or its more sophisticated variants, such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma.
Key advantages and features:- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Powerful QuantEZ software
- Solids, liquids, alloys, powders, and thin films
- Unparalleled performance for bulk and small spot analysis
- 60 kV X-ray tube for wide elemental coverage
- High-performance SDD for superior data
- Multiple automated tube filters for enhanced sensitivity
- Unmatched performance-to-price ratio
- Optional RPF-SQX Fundamental Parameters featuring Scattering FP
... Read More | Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and production environments. Designed for ease of use, the NEX QC II and NEX QC II+ feature intuitive operation with an embedded computer and built-in printer, so your team can get results quickly with no specialized technical background required. The first-generation NEX QC+ QuantEZ remains available for users who require expanded method development, advanced calibration strategies, and optional compliance features, including 21 CFR Part 11 support.
Features:- Rapid, non-destructive elemental analysis
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Multi-element capabilities, from ppm to percent levels
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Measurement of all elements from sodium (Na) to uranium (U)
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Multi-application versatility, including solids, liquids, alloys, powders, and thin films
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50 kV X-ray tube for wide elemental coverage
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High-performance silicon drift detectors
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Multiple automated tube filters for enhanced sensitivity
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Easy-to-use software with multilingual user interface
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Compact, space-saving design
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Easy sample preparation and no complex setups
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Low cost of ownership, self-installed and maintained
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Various options, including autosampler and carrying case
... Read More |