X-ray fluorescence spectrometers use high-energy X-rays or gamma rays to excite fluorescent radiation (or photons) from a sample for chemical or elemental analysis. In an energy dispersive X-ray fluorescence spectrometer (EDXRF Spectrometer), the fluorescent photons from the irradiated sample are detected without being separated first (as they are in wavelength dispersive XRF spectrometers). Therefore, EDXRF spectrometers typically have better efficiency, whereas WDXRF spectrometers have better resolution. Energy Dispersive XRF Spectrometers are used to analyze solid samples and although they have broad applications as disparate as petrochemical analysis, food safety, and plastics, one of the main attractions of this technique is that it is non-destructive, which makes it very attractive for analysis of samples that are irreplaceable, such as artifacts from an archeological site. The limit of detection for EDXRF spectrometers is typically in the parts per million (ppm) range.
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| Company | Malvern Panalytical | Malvern Panalytical |
| Item | Epsilon Xline EDXRF | Zetium Metals Edition |
| Catalog Number | Epsilon Xline | Zetium Metals Edition |
| Price | | |
| Element Range | Able to measure all valuable elements of interest, including platinum and cerium | Boron (B) to Americium (AM) |
| Sample Type | Coating line | Solids, Pressed powders, and fused beads |
| X-Ray Tube | Ag | No-drift SST R-mAX tube |
| Detector(s) | High-resolution Si drift detector SDD10 | Hi-Per Scint Detector, Duplex Detector |
| Description | In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition?and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.
Features:
- Full in-line automation. Enjoy continuous R2R production thanks to the Epsilon Xline’s seamless integration capabilities, suitable for a range of thin-film and coating applications.
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Simple and safe. The Epsilon Xline is fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data.
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A lifetime of experience. Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today – and at the same time looking to the industry’s future together.
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Maximized yield. Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations.
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Optimum materials efficiency. Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution.
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Proven, patented accuracy. Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results.
... Read More | Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be equipped to perform fast small spot mapping.
Smart Zetium:
We continuously strive to help you get the most out of our instruments, and we've connected the Zetium to our Smart Manager platform. This is a cloud-based 'control room' which provides you with a clear picture of the utilization and health of your instruments, wherever they are in the world. By connecting your Zetium to the Smart Manager, we have turned it into a Smart Zetium.... Read More |
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