X-Ray Fluorescence Spectrometer (XRF Analyzer)


Company	Rigaku Corporation	Rigaku Corporation	Rigaku Corporation
Item	Supermini200 High-Power Benchtop Sequential WDXRF Spectrometer	NEX CG II Series Indirect Excitation EDXRF Spectrometers	ZSX Primus IV Tube-above WDXRF Spectrometer
Citations	(1)
Catalog Number	Supermini200	NEX CG II Series	ZSX Primus IV
Price
Principle	Wavelength dispersive X-ray fluorescence spectroscopy (WDXRF)	Energy Dispersive X-ray Fluorescence (EDXRF)	Wavelength Dispersive X-ray Fluorescence (WDXRF)
X-Ray Tube	50 kV, 200 W Pd-anode	End window Pd anode, 50 kV 50 W or 65 kV 100 W	End window Rh-anode, 3kW or 4 kW
Goniometer Type	Inquire	Inquire	Inquire
Detector(s)	Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available)	Large-area high-throughput silicon drift detector (SDD)	SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator)
Analysis Diameter	Able to accommodate 51.5 mm diameter samples	Inquire	0.5, 1, 10, 20, 30 and 35 mm
Description	Elemental analysis of solids, liquids, powders, alloys and thin films Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential ... Read More	The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased ... Read More	As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. Features: ... Read More
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X-Ray Tube

50 kV, 200 W Pd-anode

End window Pd anode, 50 kV 50 W or 65 kV 100 W

End window Rh-anode, 3kW or 4 kW

Detector(s)

Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available)

Large-area high-throughput silicon drift detector (SDD)

SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator)

Description

Elemental analysis of solids, liquids, powders, alloys and thin films

Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential ... Read More

The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased signal-to-noise, even for challenging samples, making them an excellent choice for industrial quality control to advanced research applications.

NEX CG II Series are multi-purpose elemental analyzers that provide rapid qualitative and quantitative elemental analyses and address needs across many industries. They are suited to chemical analysis in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. Available models are NEX CG II, which offers excellent spectral resolution for trace peaks, and NEX CG II+, designed for more demanding applications requiring a higher-powered system.

Cartesian Geometry and Polarization for Trace Level Sensitivity

Unlike conventional energy dispersive X-ray fluorescence (EDXRF) spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II Series brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.

Key advantages and features:

Non-destructive elemental analysis for sodium (Na) to uranium (U)
Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
Indirect excitation for exceptionally low detection limits
High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
Large-area high-throughput silicon drift detector (SDD)
Analysis in air, helium, or vacuum
Powerful and easy-to-use QuantEZ software with multilingual user interface
Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
Various automatic sample changers accommodating up to 52 mm samples
Low cost of ownership backed by a 2-year warranty

As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

Features:

X-Ray Fluorescence Spectrometer (XRF Analyzer)

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