X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | Supermini200 High-Power Benchtop Sequential WDXRF Spectrometer | NANOHUNTER II Benchtop TXRF Spectrometer | ZSX Primus IV Tube-above WDXRF Spectrometer |
| Citations | | | |
| Catalog Number | Supermini200 | | ZSX Primus IV |
| Price | | | |
| Principle | Wavelength dispersive X-ray fluorescence spectroscopy (WDXRF) | TXRF | Wavelength Dispersive X-ray Fluorescence (WDXRF) |
| X-Ray Tube | 50 kV, 200 W Pd-anode | Mo anode, 600W | End window Rh-anode, 3kW or 4 kW |
| Goniometer Type | Inquire | N/A | Inquire |
| Detector(s) | Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available) | Silicon drift detector (SDD) | SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator) |
| Analysis Diameter | Able to accommodate 51.5 mm diameter samples | N/A | 0.5, 1, 10, 20, 30 and 35 mm |
| Description | Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, for elemental analysis of oxygen (O) through uranium (U) in almost any material, the Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).
Features: - Analyze oxygen through uranium (O -> U)
- Analyze
Solids, liquids, powders, alloys and thin films - Atmosphere
Helium or vacuum - X-ray tube
50 kV, 200 W Pd-anode - Primary beam filter
Zr standard; Al optional - Detectors
Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available) - Crystals
3-position changer - Sample size
Able to accommodate 51.5 mm diameter samples - Automatic sample changer (ASC)
Standard: 10 sample positions (for 51.5 mm diameter samples) Optional: 12 sample positions (up to 44mm diameter samples) - Vacuum
Rotary pump standard - Power
100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A ... Read More | Inquire | As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:- Analysis of elements from Be to U
- ZSX Guidance expert system software
- Digital multi-channel analyzer (D-MCA)
- EZ Analysis interface for routine measurements
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- Micro analysis to analyze samples as small as 500 µm
- 30µ tube delivers superior light element performance
- Mapping feature for elemental topography/distribution
- Helium seal means the optics are always under vacuum
... Read More |
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