| Description | Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and production environments. Designed for ease of use, the NEX QC II and NEX QC II+ feature intuitive operation with an embedded computer and built-in printer, so your team can get results quickly with no specialized technical background required. The first-generation NEX QC+ QuantEZ remains available for users who require expanded method development, advanced calibration strategies, and optional compliance features, including 21 CFR Part 11 support.
Features:
- Rapid, non-destructive elemental analysis
-
Multi-element capabilities, from ppm to percent levels
-
Measurement of all elements from sodium (Na) to uranium (U)
-
Multi-application versatility, including solids, liquids, alloys, powders, and thin films
-
50 kV X-ray tube for wide elemental coverage
-
High-performance silicon drift detectors
-
Multiple automated tube filters for enhanced sensitivity
-
Easy-to-use software with multilingual user interface
-
Compact, space-saving design
-
Easy sample preparation and no complex setups
-
Low cost of ownership, self-installed and maintained
-
Various options, including autosampler and carrying case
... Read More | Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, for elemental analysis of oxygen (O) through uranium (U) in almost any material, the Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).
Features: - Analyze oxygen through uranium (O -> U)
- Analyze
Solids, liquids, powders, alloys and thin films - Atmosphere
Helium or vacuum - X-ray tube
50 kV, 200 W Pd-anode - Primary beam filter
Zr standard; Al optional - Detectors
Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available) - Crystals
3-position changer - Sample size
Able to accommodate 51.5 mm diameter samples - Automatic sample changer (ASC)
Standard: 10 sample positions (for 51.5 mm diameter samples) Optional: 12 sample positions (up to 44mm diameter samples) - Vacuum
Rotary pump standard - Power
100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A ... Read More | Key Features - High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability
Key Features - High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability and assists with calibrations
- Attractive pricing - WDXRF performance at an affordable price
The ZSX Primus III NEXT provides rapid elemental analysis with the ability to rapidly quantify major and trace elements (Be to Cm). Its’ high-throughput, excellent sensitivity and affordable price point make it an ideal solution for industrial applications.
Tube-Above Optics The system features Rigaku’s unique tube-above optical configuration which prevents dust and particles from contaminating optical components and distorting readings as well as minimizing maintenance and maximizing uptime. This makes it ideal for the analysis of pressed powder samples. Furthermore, using wavelength dispersive X-ray fluorescence (WDXRF) provides superior spectral resolution to energy dispersive X-ray fluorescence (EDXRF).
Improved Quality of Analytical results The ZSX Primus III NEXT features a number of key upgrades from its predecessor resulting in improved results and high throughput levels. These include: - The incorporation of a digital multi-channel analyzer (D-MCA) and the efficient control of each driving unit to improve the quantitative analysis throughput by 21%.
- A S-PC LE, an environmentally friendly gas-shielded proportional detector for light elements. The S-PC LE negates the need to install a detector gas cylinder
- Powerful ZSX Guidance software, common to Rigaku’s flagship WDXRF spectrometers enabling data sharing and including scheduler function to automate and streamline operations
... Read More |