| Description | Inquire | The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased signal-to-noise, even for challenging samples, making them an excellent choice for industrial quality control to advanced research applications.
NEX CG II Series are multi-purpose elemental analyzers that provide rapid qualitative and quantitative elemental analyses and address needs across many industries. They are suited to chemical analysis in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. Available models are NEX CG II, which offers excellent spectral resolution for trace peaks, and NEX CG II+, designed for more demanding applications requiring a higher-powered system.
Cartesian Geometry and Polarization for Trace Level Sensitivity
Unlike conventional energy dispersive X-ray fluorescence (EDXRF) spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II Series brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.
Key advantages and features:
- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
- Indirect excitation for exceptionally low detection limits
- High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
- Large-area high-throughput silicon drift detector (SDD)
- Analysis in air, helium, or vacuum
- Powerful and easy-to-use QuantEZ software with multilingual user interface
- Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
- Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
- Various automatic sample changers accommodating up to 52 mm samples
- Low cost of ownership backed by a 2-year warranty
... Read More | Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and production environments. Designed for ease of use, the NEX QC II and NEX QC II+ feature intuitive operation with an embedded computer and built-in printer, so your team can get results quickly with no specialized technical background required. The first-generation NEX QC+ QuantEZ remains available for users who require expanded method development, advanced calibration strategies, and optional compliance features, including 21 CFR Part 11 support.
Features:
- Rapid, non-destructive elemental analysis
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Multi-element capabilities, from ppm to percent levels
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Measurement of all elements from sodium (Na) to uranium (U)
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Multi-application versatility, including solids, liquids, alloys, powders, and thin films
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50 kV X-ray tube for wide elemental coverage
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High-performance silicon drift detectors
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Multiple automated tube filters for enhanced sensitivity
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Easy-to-use software with multilingual user interface
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Compact, space-saving design
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Easy sample preparation and no complex setups
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Low cost of ownership, self-installed and maintained
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Various options, including autosampler and carrying case
... Read More | Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, for elemental analysis of oxygen (O) through uranium (U) in almost any material, the Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).
Features:
- Analyze oxygen through uranium (O -> U)
- Analyze
Solids, liquids, powders, alloys and thin films - Atmosphere
Helium or vacuum - X-ray tube
50 kV, 200 W Pd-anode - Primary beam filter
Zr standard; Al optional - Detectors
Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available) - Crystals
3-position changer - Sample size
Able to accommodate 51.5 mm diameter samples - Automatic sample changer (ASC)
Standard: 10 sample positions (for 51.5 mm diameter samples)
Optional: 12 sample positions (up to 44mm diameter samples) - Vacuum
Rotary pump standard - Power
100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A ... Read More | As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:- Analysis of elements from Be to U
- ZSX Guidance expert system software
- Digital multi-channel analyzer (D-MCA)
- EZ Analysis interface for routine measurements
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- Micro analysis to analyze samples as small as 500 µm
- 30µ tube delivers superior light element performance
- Mapping feature for elemental topography/distribution
- Helium seal means the optics are always under vacuum
... Read More |