| Description | RISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscopeRISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscope within one instrument.
- Quick and convenient switching between Raman and SEM measurement.
-
Automated sample transfer from one measuring position to the other.
-
Integrated software interface for user-friendly measurement control.
-
Correlation of the measurement results and image overlay.
-
No compromise in SEM and Raman imaging capabilities.
... Read More | Hexalight is the groundbreaking spectrometer at the core of witec360 Raman microscopes. It establishes new standards in throughput and spectral flexibility by incorporating an innovative lens-based, mirror-free design and providing unprecedented broadband capabilities.
Engineered for the needs of Hexalight is the groundbreaking spectrometer at the core of witec360 Raman microscopes. It establishes new standards in throughput and spectral flexibility by incorporating an innovative lens-based, mirror-free design and providing unprecedented broadband capabilities.
Engineered for the needs of advanced research and development, Hexalight delivers exceptional performance across the spectrum, making it ideal for multi-user environments by accommodating diverse applications within a single device. Its modular setup ensures long-term scalability to adapt to evolving needs and budgetary conditions.
- Broadband capability Achieve top-tier optical performance across a wide spectral range (350 – 1100 nm).
- Scalable architecture Easily adapt to future experimental needs with six grating positions for cost-efficient upgrades.
- Streamlined operation Simplify handling and protect grating integrity with software-controlled grating selection for increased system uptime, longevity and user convenience.
- Trustable, reproducible results Ensure the highest image accuracy and consistent, distortion-free results with ultra-precise automated grating positioning and the OHD lens-based optics.
- Exceptional signal sensitivity Use reduced laser power for sensitive samples and to detect even the faintest Raman signals via Hexalight’s mirror-free beam path and ultra-sensitive CCD cameras that maximize the signal intensity.
- High-speed data acquisition Accelerate workflows and reduce integration times through Hexalight’s outstanding sensitivity.
... Read More | ParticleScout is an advanced particle analysis tool for witec360 Raman microscopes that finds, classifies and identifies microparticles over even large sample areas.
User-defined categorization of particles by shape and size offers access to wide-ranging properties, and the results of the ParticleScout is an advanced particle analysis tool for witec360 Raman microscopes that finds, classifies and identifies microparticles over even large sample areas.
User-defined categorization of particles by shape and size offers access to wide-ranging properties, and the results of the measurement are then presented in a report that provides a comprehensive description of the sample.
ParticleScout features the most flexible and useful sample survey capabilities available.
- White-light Microscopy: Bright field/dark field, transmission/reflection.
-
Image Stitching: Scans of many sample areas can be combined into one measurement for a large-area overview of widely distributed particles.
-
Focus Stacking: This unique capability dramatically increases the depth of focus for sharp and defined particle imaging.
-
Integration time optimisation – reduces measurement time and minimizes the effects of fluorescence.
-
Vignetting correction – ensures uniform brightness throughout the image plane.
-
Smart zoom – displays particle information dynamically depending on viewed area.
-
Sample area targeting – allows the selection of multiple regions of interest for each investigation.
-
Dark-field, bright-field, epifluorescence and transmission sample illumination – provides the best option for each type of particle.
-
Round sample wedge sectioning – allows the selection of an area for data acquisition, typically on a filter, that can be extrapolated to represent the whole.
-
Smart separation of particles – differentiates materials in densely packed, heterogeneous samples.
-
• Quantitative report formatting – presents data using table, bar graph histogram and pie chart templates for ease and clarity.
... Read More | The witec360 Raman microscope, successor to the pioneering alpha300 series, sets new standards in performance and broadband capability. Its fundamentally modular design provides immediate and long-term value with easy onboarding for Raman newcomers and the versatility to keep pace with varied and The witec360 Raman microscope, successor to the pioneering alpha300 series, sets new standards in performance and broadband capability. Its fundamentally modular design provides immediate and long-term value with easy onboarding for Raman newcomers and the versatility to keep pace with varied and quickly evolving applications.
- Acquire research-grade results: Optimised optics throughout the entire beam path deliver class-leading speed, sensitivity, and resolution for leading-edge research and development.
- Experience unprecedented versatility: Broadband capabilities provide the spectral flexibility needed for demanding research tasks and diverse applications in multi-user facilities.
- Gain comprehensive insight: Seamless integration of imaging techniques enables the correlation of chemical and structural properties for a more thorough understanding of samples.
- Configure your microscope for current and evolving experiments: Modular design offers a wide range of capabilities and upgrade options to deliver tailored solutions and scalability to match your institution’s requirements and resources.
- Enhance productivity with intelligent automation: Advanced hardware automation and intuitive software simplify data acquisition and analysis for operational efficiency and fast onboarding of users with different experience levels.
- Ensure consistency and transparency: Multi-user management, internal calibration, automated reporting, and streamlined analysis facilitate reproducibility and support institutional and regulatory compliance.
... Read More | The witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in theirThe witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in their semiconductor samples and wafers.
The microscope’s extended-range scanning stage enables the inspection of up to 12” (300 mm) wafers and the acquisition of large-area Raman images. It is equipped with vibration damping and active focus stabilization to compensate for topographic variation during measurements over large areas or long acquisition times. All microscope components are fully automated, permitting remote-control and the implementation of standard measurement procedures.
- Analysis of wide-bandgap semiconductors and layered structures.
- Surface analyses, depth scans and 3D imaging.
- Industry-leading confocal Raman and PL microscope for high speed, sensitivity and resolution – simultaneously.
- Scientific-grade, wavelength-optimised Hexalight spectrometer for high signal sensitivity and spectral resolution.
- Large-area scanning (300 x 350 mm) for wafer inspection.
- Active focus stabilization for large-area measurements (TrueSurface).
... Read More |