Multispectral imaging systems are used by the food industry, the pharmaceutical industry, and in medical, biology, and chemistry labs for analysis and quality control. Types of multispectral imaging include NIR (near infrared), which can provide a quick and accurate analysis of samples within the 700–2500 nm wavelength range, and Raman, which measures the scattering of near infrared, visible, or near ultraviolet light. In both cases, the photons that are emitted and absorbed by the sample allow identification of specific molecules.
Considerations for purchasing a Multispectral Imaging System
Sensitivity, specificity, and resolution of images can vary between chemical imaging systems. Another feature to be aware of is what type of imaging the system is capable of and whether other types of imaging can be integrated into the system.
Discover and compare Multispectral Imaging Systems:
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| Company | Oxford Instruments | Oxford Instruments | Oxford Instruments |
| Item | alphaCART – Mobile Raman System | ParticleScout – Raman-based Particle Analysis | witec360 Semiconductor Edition Raman Microscope |
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| Catalog Number | | ParticleScout™ | |
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| Description | alphaCART is Oxford Instruments' mobile, confocal Raman system for all applications that require bringing the lab to the sample, including specimens that don’t fit under a microscope and fragile or precious objects that can’t be removed from secure locations.
The system's high confocality and alphaCART is Oxford Instruments' mobile, confocal Raman system for all applications that require bringing the lab to the sample, including specimens that don’t fit under a microscope and fragile or precious objects that can’t be removed from secure locations.
The system's high confocality and signal sensitivity also allow measurements through protective glass and windows, which enable studies of gases or chemical processes inside reaction chambers and other enclosures.
- Freely positionable, fibre-coupled Raman probe.
- High spectral and spatial resolution, confocality, and signal sensitivity.
- Sample survey with white-light illumination and colour video camera.
- Objective, laser and spectrometer configuration options.
- Rolling flight case containing and protecting all components (optional).
- Polarisation-sensitive measurements (optional).
- Full compatibility with the witec360's upgrades and accessories.
... Read More | ParticleScout is an advanced particle analysis tool for witec360 Raman microscopes that finds, classifies and identifies microparticles over even large sample areas.
User-defined categorization of particles by shape and size offers access to wide-ranging properties, and the results of the ParticleScout is an advanced particle analysis tool for witec360 Raman microscopes that finds, classifies and identifies microparticles over even large sample areas.
User-defined categorization of particles by shape and size offers access to wide-ranging properties, and the results of the measurement are then presented in a report that provides a comprehensive description of the sample.
ParticleScout features the most flexible and useful sample survey capabilities available.
- White-light Microscopy: Bright field/dark field, transmission/reflection.
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Image Stitching: Scans of many sample areas can be combined into one measurement for a large-area overview of widely distributed particles.
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Focus Stacking: This unique capability dramatically increases the depth of focus for sharp and defined particle imaging.
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Integration time optimisation – reduces measurement time and minimizes the effects of fluorescence.
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Vignetting correction – ensures uniform brightness throughout the image plane.
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Smart zoom – displays particle information dynamically depending on viewed area.
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Sample area targeting – allows the selection of multiple regions of interest for each investigation.
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Dark-field, bright-field, epifluorescence and transmission sample illumination – provides the best option for each type of particle.
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Round sample wedge sectioning – allows the selection of an area for data acquisition, typically on a filter, that can be extrapolated to represent the whole.
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Smart separation of particles – differentiates materials in densely packed, heterogeneous samples.
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• Quantitative report formatting – presents data using table, bar graph histogram and pie chart templates for ease and clarity.
... Read More | The witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in theirThe witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in their semiconductor samples and wafers.
The microscope’s extended-range scanning stage enables the inspection of up to 12” (300 mm) wafers and the acquisition of large-area Raman images. It is equipped with vibration damping and active focus stabilization to compensate for topographic variation during measurements over large areas or long acquisition times. All microscope components are fully automated, permitting remote-control and the implementation of standard measurement procedures.
- Analysis of wide-bandgap semiconductors and layered structures.
- Surface analyses, depth scans and 3D imaging.
- Industry-leading confocal Raman and PL microscope for high speed, sensitivity and resolution – simultaneously.
- Scientific-grade, wavelength-optimised Hexalight spectrometer for high signal sensitivity and spectral resolution.
- Large-area scanning (300 x 350 mm) for wafer inspection.
- Active focus stabilization for large-area measurements (TrueSurface).
... Read More |
| Type | Raman Chemical Imaging | Inquire | Raman Chemical Imaging |
| Wavelength Range | Inquire | UV-VIS-NIR | Inquire |
| Spectral Bandwidth | UV-VIS-NIR | UV-VIS-NIR | UV-VIS-NIR |
| Detector(s) | CCD/EMCCD | CCD/EMCCD | CCD/EMCCD |
| Get Quote | | | |