| Description | alphaCART is Oxford Instruments' mobile, confocal Raman system for all applications that require bringing the lab to the sample, including specimens that don’t fit under a microscope and fragile or precious objects that can’t be removed from secure locations.
The system's high confocality and alphaCART is Oxford Instruments' mobile, confocal Raman system for all applications that require bringing the lab to the sample, including specimens that don’t fit under a microscope and fragile or precious objects that can’t be removed from secure locations.
The system's high confocality and signal sensitivity also allow measurements through protective glass and windows, which enable studies of gases or chemical processes inside reaction chambers and other enclosures.
- Freely positionable, fibre-coupled Raman probe.
- High spectral and spatial resolution, confocality, and signal sensitivity.
- Sample survey with white-light illumination and colour video camera.
- Objective, laser and spectrometer configuration options.
- Rolling flight case containing and protecting all components (optional).
- Polarisation-sensitive measurements (optional).
- Full compatibility with the witec360's upgrades and accessories.
... Read More | RISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscopeRISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscope within one instrument.
- Quick and convenient switching between Raman and SEM measurement.
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Automated sample transfer from one measuring position to the other.
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Integrated software interface for user-friendly measurement control.
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Correlation of the measurement results and image overlay.
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No compromise in SEM and Raman imaging capabilities.
... Read More | The patented TrueSurface Microscopy option for witec360 microscopes enables confocal Raman imaging guided by surface topography to maintain an optimal focus throughout a measurement.
The pioneering topographic Raman imaging technology uses an integrated optical profilometer to provide one-pass The patented TrueSurface Microscopy option for witec360 microscopes enables confocal Raman imaging guided by surface topography to maintain an optimal focus throughout a measurement.
The pioneering topographic Raman imaging technology uses an integrated optical profilometer to provide one-pass simultaneous operation.
- Enables 3D chemical characterisation of rough, inclined or irregularly shaped samples.
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• Compensates for variations during measurements with long integration times.
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• Features variable offset from the sample surface.
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• Integrates seamlessly with Raman, PL, white-light microscopy.
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• Further reduces sample preparation effort.
... Read More | The witec360 Raman microscope, successor to the pioneering alpha300 series, sets new standards in performance and broadband capability. Its fundamentally modular design provides immediate and long-term value with easy onboarding for Raman newcomers and the versatility to keep pace with varied and The witec360 Raman microscope, successor to the pioneering alpha300 series, sets new standards in performance and broadband capability. Its fundamentally modular design provides immediate and long-term value with easy onboarding for Raman newcomers and the versatility to keep pace with varied and quickly evolving applications.
- Acquire research-grade results: Optimised optics throughout the entire beam path deliver class-leading speed, sensitivity, and resolution for leading-edge research and development.
- Experience unprecedented versatility: Broadband capabilities provide the spectral flexibility needed for demanding research tasks and diverse applications in multi-user facilities.
- Gain comprehensive insight: Seamless integration of imaging techniques enables the correlation of chemical and structural properties for a more thorough understanding of samples.
- Configure your microscope for current and evolving experiments: Modular design offers a wide range of capabilities and upgrade options to deliver tailored solutions and scalability to match your institution’s requirements and resources.
- Enhance productivity with intelligent automation: Advanced hardware automation and intuitive software simplify data acquisition and analysis for operational efficiency and fast onboarding of users with different experience levels.
- Ensure consistency and transparency: Multi-user management, internal calibration, automated reporting, and streamlined analysis facilitate reproducibility and support institutional and regulatory compliance.
... Read More | The witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in theirThe witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in their semiconductor samples and wafers.
The microscope’s extended-range scanning stage enables the inspection of up to 12” (300 mm) wafers and the acquisition of large-area Raman images. It is equipped with vibration damping and active focus stabilization to compensate for topographic variation during measurements over large areas or long acquisition times. All microscope components are fully automated, permitting remote-control and the implementation of standard measurement procedures.
- Analysis of wide-bandgap semiconductors and layered structures.
- Surface analyses, depth scans and 3D imaging.
- Industry-leading confocal Raman and PL microscope for high speed, sensitivity and resolution – simultaneously.
- Scientific-grade, wavelength-optimised Hexalight spectrometer for high signal sensitivity and spectral resolution.
- Large-area scanning (300 x 350 mm) for wafer inspection.
- Active focus stabilization for large-area measurements (TrueSurface).
... Read More |