Fast color coded images sensitive to the smallest change in crystal orientation
Ewing, NJ - With the addition of the ARGUS forescattered (FSE) / backscattered electron (BSE) imaging system, Bruker’s CrystAlign EBSD system is able to provide valuable additional information for meaningful and efficient EBSD analysis.
Three FSE detectors positioned below the screen are used for acquiring color coded orientation contrast images, while two BSE detectors placed above the phosphor screen are used to acquire phase contrast images.
In a typical EBSD experiment the standard SEM SE and BSE detectors are poorly positioned and tend to produce low quality, noisy images due to the high tilt angle of the sample. By positioning the BSE detectors above the phosphor screen and inclined towards the sample, the ARGUS system ensures optimum signal strength. The phase density contrast signal can then be either used individually or mixed with the FSE signal.
Each one of the three FSE detectors positioned below the screen capture a different part of the diffraction signal, which is highly anisotropic and dependent upon crystal orientation. By controlling each detector separately and assigning one of three RGB codes to each detector, the ARGUS FSE imaging system produces color coded images with unparalled sensitivity to the smallest orientation change.
Due to its high sensitivity the ARGUS imaging system is ideal for detecting the very beginning of plastic deformation, rapid checking of microstructural homogeneity, and quick and efficient determination of the area of interest for EBSD analysis.
For more information, or to schedule a demonstration, please visit our web site www.bruker.com or contact us directly.
Contact:
Bruker Nano
Don Becker, Regional Sales Manager
1239 Parkway Ave, Suite 203
Ewing, NJ 08628
Tel: 609.771.4473
Email: [email protected]