Ewing, NJ - February 23, 2012- The e-FlashHR high resolution EBSD detector from Bruker is the latest addition to the CrystAlign EBSD analysis system.
Featuring a resolution of 1600 x 1200 pixels combined with excellent optics, the e-FlashHR is able to display the finest pattern details, making it ideal for the analysis of fine-grained and/or nonconductive materials, nanomaterials, and for use at low beam current and accelerating voltages.
A unique mechanism allows in-situ tilting of the detector to help optimize pattern quality while accommodating both oversize and very small samples at a variety of working distances. The e-FlashHR also features a motorized high precision drive which can be software controlled or operated manually via a touch panel on the side of the detector. Integrated touch sensors retract the detector immediately should the probe detect any resistance in movement, and phosphor screens are easily exchanged by the user.
Running under Bruker’s proven ESPRIT software platform, the CrystAlign EBSD system is able to acquire EDS spectra, HyperMaps and EBSD patterns simultaneously, significantly speeding up EBSD analysis while providing the ability to distinguish between phases which create similar patterns. CrystAlign’s unique pattern streaming process stores the EBSD pattern for each measured point in a map, allowing live display of the data during acquisition. The operator can then choose to store all patterns and/or band positions, phase and orientation, or only the orientation information. Automatic calibration and analysis routines simplify system operation, and the system is fully integrated into our ESPRIT EDS software platform.
For more information, or to schedule a demonstration, please visit our web site www.bruker-nano.com or contact us directly.
Contact:
Bruker Nano
Don Becker, Regional Sales Manager
1239 Parkway Ave, Suite 203
Ewing, NJ 08628
Tel: 609.771.4473
Email: [email protected]