The experimental setup of the laser-driven epithermal neutron generation and resonance absorption measurement using the TOF method. The target setup shows spatial position relationship of the laser beam, CD foil, Be and neutron moderator. The laser-target chamber was kept at high vaccum during the experiment. The beamline setup including samples and detectors are shown in the figure. Credit: Zechen Lan et al.
Researchers from Osaka University have developed a novel technique to accurately measure temperature using neutrons. The technique could be used to improve electronic device performance in several industries.
Existing methods to quickly measure temperature within an electronic device have thus far been unable to do so accurately. The new method relies on neutron resonance absorption (NRA) to deduce the properties of a material within an electronic device. To generate the neutrons used in the study, the team used high-intensity lasers and then decelerated the neutrons to a low energy level before passing them through a sample.
Because the temporal signal of the NRA is altered in a predictable manner when a samples temperature changes, the researchers were able to quickly determine the temperatures of the sample.
"This technology makes it possible to instantaneously and accurately measure temperature," said Zechen Lan, the lead author of the study. "As our method is non-destructive, it can be used to monitor devices like batteries and semiconductor devices."
"Using lasers to generate and accelerate ions and neutrons is nothing new, but the techniques we've developed in this study represent an exciting advance," said Akifumi Yogo. "We expect that the high temporal resolution will allow electronics to be examined in greater detail, help us to understand normal operating conditions, and pinpoint abnormalities."