X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
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GBC Scientific Equipment
- Medium Frequency IGBT type; Power: 3 kW; Voltage: 60 kV; Current: 80 mA; Stability: 0.005% for 10% supply fluctuation
- ?-2? or ?-? (horizontal sample stage option available); variable radius capability
- Xe Proportional Detector with Graphite Monochromator; Parallel Beam or Thin Film Detector; Dual or Bifurcated Arm options
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