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X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
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Hitachi High-Tech America, Inc.
- X-ray Fluorescence
- (Rh target) Voltage: 15 kV, 40 kV, 50 kV | Current: 1 mA (10 µA to 1,000 µA variable) Bottom-Up method.
- Silicon PIN-diode or high resolution silicon-drift detector (SDD)
- 1, 3, or 5 mm (programmable)
Hitachi High-Tech America, Inc.
- Transmission X-ray imaging and X-ray fluorescence spectroscopy
- XRF Analyzer - Small Air-cooled X-ray tube
X-ray transmission - Water-cooled X-ray tube - High Resolution SDD
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Hitachi High-Tech America, Inc.
- XRF Coating Thickness Gauge
- Air-cooled small X-Ray Tube
- Proportional counter
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Hitachi High-Tech America, Inc.
Hitachi High-Tech America, Inc.
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- Tungsten (W) target microfocus X-ray tube, top-down orientation
- Silicon drift detector (SDD)
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Hitachi High-Tech America, Inc.
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Hitachi High-Tech America, Inc.
- Energy Dispersive X-Ray Fluorescence
- Oxford Instruments' X-ray tube
- Silicon-drift detector (SDD)
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Hitachi High-Tech America, Inc.
- Energy Dispersive X-Ray Fluorescence
- High-resolution silicon drift detector (SDD)
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