X-Ray Fluorescence Spectrometer (XRF Analyzer)

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X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.

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EA1000AIII and EA1400 Benchtop XRF analyzers for RoHS
Hitachi High-Tech America, Inc.
  • Principle:
    X-ray Fluorescence
  • X-Ray Tube:
    (Rh target) Voltage: 15 kV, 40 kV, 50 kV | Current: 1 mA (10 µA to 1,000 µA variable) Bottom-Up method.
  • Detector(s):
    Silicon PIN-diode or high resolution silicon-drift detector (SDD)
  • Analysis Diameter:
    1, 3, or 5 mm (programmable)
EA8000A: X-ray Particle Contaminant Analyzer for Lithium-ion Battery Production
Hitachi High-Tech America, Inc.
  • Principle:
    Transmission X-ray imaging and X-ray fluorescence spectroscopy
  • X-Ray Tube:
    XRF Analyzer - Small Air-cooled X-ray tube
    X-ray transmission - Water-cooled X-ray tube
  • Detector(s):
    High Resolution SDD
  • Analysis Diameter:
    Inquire
FT110A
Hitachi High-Tech America, Inc.
  • Principle:
    XRF Coating Thickness Gauge
  • X-Ray Tube:
    Air-cooled small X-Ray Tube
  • Detector(s):
    Proportional counter
  • Analysis Diameter:
    Inquire
FT160 Series
Hitachi High-Tech America, Inc.
  • Principle:
    Inquire
  • Analysis Diameter:
    Inquire
FT230
Hitachi High-Tech America, Inc.
  • Principle:
    Inquire
  • X-Ray Tube:
    Tungsten (W) target microfocus X-ray tube, top-down orientation
  • Detector(s):
    Silicon drift detector (SDD)
  • Analysis Diameter:
    Inquire
LAB-X and X-Supreme Range Benchtop XRF elemental analysis
Hitachi High-Tech America, Inc.
  • Principle:
    Inquire
  • X-Ray Tube:
    Inquire
  • Detector(s):
    Inquire
  • Analysis Diameter:
    Inquire
Vulcan Handheld LIBS Analyzer
Hitachi High-Tech America, Inc.
  • Principle:
    Energy Dispersive X-Ray Fluorescence
  • X-Ray Tube:
    Oxford Instruments' X-ray tube
  • Detector(s):
    Silicon-drift detector (SDD)
  • Analysis Diameter:
    Inquire
X-Strata920 EDXRF Spectrometer
Hitachi High-Tech America, Inc.
  • Principle:
    Energy Dispersive X-Ray Fluorescence
  • Detector(s):
    High-resolution silicon drift detector (SDD)
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  • Hitachi High-Tech America, Inc.
  • JEOL USA, Inc.
  • Malvern Panalytical
  • Rigaku Americas Corporation
  • Shimadzu
  • Thermo Fisher Scientific
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