X-Ray Fluorescence Spectrometer (XRF Analyzer)

X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.

Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.

CompanyRigaku CorporationRigaku CorporationRigaku Corporation
ItemSupermini200 High-Power Benchtop Sequential WDXRF SpectrometerNEX CG II Series Indirect Excitation EDXRF SpectrometersZSX Primus III NEXT High-Throughput/Affordable WDXRF Spectrometer
Citations
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Catalog NumberSupermini200NEX CG II SeriesZSX Primus III NEXT
Price
PrincipleWavelength dispersive X-ray fluorescence spectroscopy (WDXRF)Energy Dispersive X-ray Fluorescence (EDXRF)Wavelength dispersive
X-Ray Tube50 kV, 200 W Pd-anodeEnd window Pd anode, 50 kV 50 W or 65 kV 100 WEnd window type Rh target 3 kW
Detector(s)Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available)Large-area high-throughput silicon drift detector (SDD)SC (Scintillation counter), F-PC (Gas flow proportional counter)
Optional: S-PC LE (Gas sealed proportional counter: does not require P-10 gas)
Analysis DiameterAble to accommodate 51.5 mm diameter samplesInquireInquire
DescriptionElemental analysis of solids, liquids, powders, alloys and thin films

Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential
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The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased ... Read MoreKey Features
  • High-end WDXRF – Ideal for industrial applications
  • High throughput – Obtain accurate results in minutes
  • Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
  • Extended detection rage – Be to Cm
  • ZSX Guidance software – Increases usability
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