| Detector(s) | Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available) | Silicon drift detector (SDD) | Large-area high-throughput silicon drift detector (SDD) | SC (Scintillation counter), F-PC (Gas flow proportional counter)
Optional: S-PC LE (Gas sealed proportional counter: does not require P-10 gas) | SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator) |
| Description | Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential Elemental analysis of solids, liquids, powders, alloys and thin films
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, for elemental analysis of oxygen (O) through uranium (U) in almost any material, the Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).
Features:
- Analyze oxygen through uranium (O -> U)
- Analyze
Solids, liquids, powders, alloys and thin films - Atmosphere
Helium or vacuum - X-ray tube
50 kV, 200 W Pd-anode - Primary beam filter
Zr standard; Al optional - Detectors
Scintillation counter and F-PC (S-PC not requiring P10 gas optionally available) - Crystals
3-position changer - Sample size
Able to accommodate 51.5 mm diameter samples - Automatic sample changer (ASC)
Standard: 10 sample positions (for 51.5 mm diameter samples)
Optional: 12 sample positions (up to 44mm diameter samples) - Vacuum
Rotary pump standard - Power
100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A ... Read More | Inquire | The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased The Rigaku NEX CG II Series are powerful XRF spectrometers that push the boundaries of EDXRF technology. They deliver rapid, non-destructive multi-element analyses (Na to U) from trace concentrations up to the percent level. The Cartesian configuration and indirect excitation provide increased signal-to-noise, even for challenging samples, making them an excellent choice for industrial quality control to advanced research applications.
NEX CG II Series are multi-purpose elemental analyzers that provide rapid qualitative and quantitative elemental analyses and address needs across many industries. They are suited to chemical analysis in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. Available models are NEX CG II, which offers excellent spectral resolution for trace peaks, and NEX CG II+, designed for more demanding applications requiring a higher-powered system.
Cartesian Geometry and Polarization for Trace Level Sensitivity
Unlike conventional energy dispersive X-ray fluorescence (EDXRF) spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II Series brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.
Key advantages and features:
- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
- Indirect excitation for exceptionally low detection limits
- High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
- Large-area high-throughput silicon drift detector (SDD)
- Analysis in air, helium, or vacuum
- Powerful and easy-to-use QuantEZ software with multilingual user interface
- Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
- Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
- Various automatic sample changers accommodating up to 52 mm samples
- Low cost of ownership backed by a 2-year warranty
... Read More | Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability
Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability and assists with calibrations
- Attractive pricing - WDXRF performance at an affordable price
The ZSX Primus III NEXT provides rapid elemental analysis with the ability to rapidly quantify major and trace elements (Be to Cm). Its’ high-throughput, excellent sensitivity and affordable price point make it an ideal solution for industrial applications.
Tube-Above Optics
The system features Rigaku’s unique tube-above optical configuration which prevents dust and particles from contaminating optical components and distorting readings as well as minimizing maintenance and maximizing uptime. This makes it ideal for the analysis of pressed powder samples. Furthermore, using wavelength dispersive X-ray fluorescence (WDXRF) provides superior spectral resolution to energy dispersive X-ray fluorescence (EDXRF).
Improved Quality of Analytical results
The ZSX Primus III NEXT features a number of key upgrades from its predecessor resulting in improved results and high throughput levels. These include: - The incorporation of a digital multi-channel analyzer (D-MCA) and the efficient control of each driving unit to improve the quantitative analysis throughput by 21%.
- A S-PC LE, an environmentally friendly gas-shielded proportional detector for light elements. The S-PC LE negates the need to install a detector gas cylinder
- Powerful ZSX Guidance software, common to Rigaku’s flagship WDXRF spectrometers enabling data sharing and including scheduler function to automate and streamline operations
... Read More | As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:- Analysis of elements from Be to U
- ZSX Guidance expert system software
- Digital multi-channel analyzer (D-MCA)
- EZ Analysis interface for routine measurements
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- Micro analysis to analyze samples as small as 500 µm
- 30µ tube delivers superior light element performance
- Mapping feature for elemental topography/distribution
- Helium seal means the optics are always under vacuum
... Read More |