M4 Tornado features capillary optics and X-Flash® SDD
Ewing, NJ - The M4 Tornado µ-XRF system from Bruker offers high speed analysis with excellent spatial resolution by utilizing capillary optics and silicon drift technology.
Optimized for rapid elemental analysis, the M4’s optics concentrates the x-ray excitation into a spot as small as 25 µm, yielding count rates of up to 500,000 counts per second. Bruker’s X-Flash® Silicon Drift Detector processes high count rates with excellent energy resolution, resulting in fast, accurate spectral analysis and elemental maps.
Coupled with a high-speed stage that moves continuously, measurements can be taken “on-the-fly”, allowing large areas to be mapped quickly.
Accurate sample positioning is supported by a fish-eye chamber camera and an integrated light microscope with 10x and 100x magnification.
Able to operate either at atmospheric pressure or under vacuum, the M4 Tornado is the ideal instrument for a variety of applications including forensics, RoHS compliance, coating analysis and more.
For more information, please visit our web site www.bruker-nano.com or contact us directly.
Contact:
Bruker Nano
Don Becker, International Sales Manager
1239 Parkway Ave, Suite 203
Ewing, NJ 08628
Tel: 609.771.4473
Email: [email protected]