Atomic Force Microscope alpha300 A from WITec GmbH

Atomic Force Microscope alpha300 A from WITec GmbH

Atomic Force Microscope alpha300 A from WITec GmbH

Description

The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors.

All standard AFM modes are supported, assuring the highest flexibility throughout the full range of AFM applications. Whether you work in air or liquid environments, or even with delicate and soft samples, the alpha300 A is ideally suited to the investigation of topographic structures at the highest resolution. For high-performance materials research imaging tasks, the alpha300 can be equipped with the Pulsed Force Mode, allowing local surface properties such as local adhesion or stiffness to be imaged along with topography on the nanometer scale.

  • Detailed Specifications
  • ItemAtomic Force Microscope alpha300 A
  • CompanyWITec GmbH
  • PriceGet Quote
  • Catalog Numberalpha300 A
  • QuantityEA
  • Operating Mode(s)Contact Mode or Lateral Force, Pulsed Force, AC-Mode or Phase Imaging, Magnetic Force, Nanolithography or Nanomanipulation
  • Scan Range100 x 100 x 20 um
  • Vibration IsolationIntegrated Active Vibration Isolation System
WITec GmbH
WITec GmbH
Lise-Meitner-Str. 6
89081 Ulm
Germany
Phone: +49 (0)731 140 700
Fax: +49 (0)731 140 70 200
Website: www.witec.de