Atomic Force Microscopes (AFM Microscope)

Atomic force microscopes (AFMs), or scanning force microscopes, provide a high-resolution 3-D surface profile using a cantilever with a sharp tip to scan the surface to be imaged. AFM measures the deflection of the lever, not the force itself, with most systems using a laser beam deflection system. Scanning ranges of 1–100 µm are typical. AFM’s ability to image almost any type of surface, including biological samples, polymers, ceramics, and glass, with little sample preparation, lends it toward use in nanotechnology, the life sciences, electrochemistry, and materials science.

Modes of operation include contact mode; noncontact mode, which minimizes sample damage; force modulation; and tapping mode, which makes use of a piezoelectric element to vibrate the cantilever. Interesting features include dual-lens optics for nano education, easy tip exchange without laser adjustment, passive or active vibration isolation to eliminate noise, and systems optimized to measure larger samples.

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MERLIN Field Emission Scanning Electron Microscopes
  • Scan Range: Inquire
  • Operating Mode(s): Inquire
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Easyscan 2 AFM Atomic Force Microscope System
  • Scan Range: 10 or 110 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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FlexAFM Atomic Force Microscope
  • Scan Range: 10 or 100 um
  • Operating Mode(s): Dynamic force, Static force, Lateral force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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LensAFM Atomic Force Microscope and Lens
  • Scan Range: 70 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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NaioAFM Atomic Force Microscope System
  • Scan Range: 70 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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NaniteAFM Mountable Atomic Force Microscope System
  • Scan Range: 10 or 110 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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Atomic Force Microscope alpha300 A
  • Scan Range: 100 x 100 x 20 um
  • Operating Mode(s): Contact Mode or Lateral Force, Pulsed Force, AC-Mode or Phase Imaging, Magnetic Force, Nanolithography or Nanomanipulation
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  • Scan Range: 100 x 100 x 20 um
  • Operating Mode(s): Confocal Raman Microscopy and Imaging, Confocal Microscopy, Atomic Force Microscopy
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TrueSurface Microscopy Profilometer and Imaging System
  • Scan Range: 50 x 100 mm to 200 x 200 mm (Scan Range X/Y), 10 mm / 20 µm (Scan Range Z)
  • Operating Mode(s): Confocal Raman Microscopy and Imaging, Confocal Microscopy, Atomic Force Microscopy
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attoAFM I Atomic Force Microscope

attoAFM I Atomic Force Microscope

attocube systems AG

  • Scan Range: 40 x 40 um² (@ 300 K), 30 x 30 um² (@ 4 K)
  • Operating Mode(s): Contact, Non Contact, MFM, EFM, SGM, ct-AFM (conducting tip AFM)
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attoAFM/CFM Combined Atomic Force and Confocal Microscope
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  • Operating Mode(s): Non Contact (AFM tip)
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attoAFM/STM Combined Atomic Force and Scanning Tunneling Microscope
  • Scan Range: 40 x 40 um² (@ 300 K), 9 x 9 um² (@ 4 K)
  • Operating Mode(s): Non Contact, MFM, EFM, SGM
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Academia AFM System

Academia AFM System

Nanonics Imaging Ltd

  • Scan Range: 70 micron XY, 5 micron Z (10 micron XY on request)
  • Operating Mode(s): Contact, Non Contact or Intermittent Contact Modes
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Combined SEM/FIB/AFM System

Combined SEM/FIB/AFM System

Nanonics Imaging Ltd

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  • Operating Mode(s): Contact, Non Contact or Intermittent Contact Modes in SPM
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CryoView 2000 Low Temperature SPM System
  • Scan Range: 25 um (Z-range) or 50 um (XY-range)
  • Operating Mode(s): AFM - Contact, Non-Contact, Intermittent-Contact, Confocal Microscopy, Near-field Optical Microscopy
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Hydra Bio-SPM

Hydra Bio-SPM

Nanonics Imaging Ltd

  • Scan Range: 30, 100, 130 microns (XYZ) or 160 microns (XY)
  • Operating Mode(s): AC Mode, Contact Mode (Optional) or All AFM Modes of Operation with probe or sample scanning and more
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MultiView 2000 Scanning Probe Microscope
  • Scan Range: up to 100 um (XYZ scan range) or up to 200 um (XYZ combined scan range)
  • Operating Mode(s): Active channels, Functional modes, Manipulation modes, Spectroscopy modes, Optical Far-field, Optical Near-field
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MultiView 4000 Multiprobe Scanning Probe Microscope
  • Scan Range: 30, 100, 130 microns (XYZ) or 160 microns (XY)
  • Operating Mode(s): AFM - AC Mode, Contact Mode (Optional) or All AFM Modes of Operation with probe or sample scanning and more, Near-field Optical Imaging & Illumination, NanoIndentation and more
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Optometronic 4000 Multiprobe Near-Field Optical and AFM
  • Scan Range: 30, 100, 130 microns (XYZ) or 160 microns (XY)
  • Operating Mode(s): AFM - AC Mode, Contact Mode (Optional) or All AFM Modes of Operation with probe or sample scanning and more, Near-field Optical Imaging and Illumination, Differential Interference Contrast , Refractive-Index Profiling, Thermal Conductivity and Spreading Resistance Profiling and more
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NX10 Research AFM Microscope

NX10 Research AFM Microscope

Park Systems Inc

  • Scan Range: 50 x 50 um (XY Scanner), 15 um (Z Scanner)
  • Operating Mode(s): True Non-Contact AFM, Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage and more
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XE-100 Research-Grade AFM Microscope
  • Scan Range: up to 100 x 100 um (XY Scanner), 12 or 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM,Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-120 Research AFM Microscope
  • Scan Range: 100 x 100 um (XY Scanner), 12 or 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM, Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-150 Research AFM Microscope
  • Scan Range: 100 x 100 um (XY Scanner), up to 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM, Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-3DM AFM Microscope for High-Res 3D Metrology
  • Scan Range: 100 x 100 um (XY Scanner - large mode), 50 x 50 um (XY Scanner - medium mode), 10 x 10 um (XY Scanner - small mode), 12 um (Z Scanner - high voltage mode), 1.7 um (Z Scanner - low voltage mode)
  • Operating Mode(s): True Non-Contact AFM
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XE-70 Research-Grade AFM Miscroscope
  • Scan Range: up to 100 x 100 um (XY Scanner), 12 or 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM,Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-Bio Research AFM Microscope
  • Scan Range: 100 x 100 um (XY Scanner), 25 um (Z Scanner)
  • Operating Mode(s): Standard Imaging, Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM, Ion Conductance Microscopy (ICM), Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method, Raman Spectroscopy (Nano-Raman) or Tip-Enhanced Raman Spectroscopy (TERS)
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XE-HDM AFM Microscope

XE-HDM AFM Microscope

Park Systems Inc

  • Scan Range: 100 x 100 um (XY Scanner - high voltage), 10 x 10 um (XY Scanner - low voltage), 12 um (Z Scanner - high voltage), 1.7 um (Z Scanner - low voltage)
  • Operating Mode(s): True Non-Contact AFM, Scanning Electron (SEM) or Magnetic Force Microscopy (MFM)
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XE-PTR AFM Microscope for Metrology
  • Scan Range: 100 x 100 um (XY Scanner - high voltage), 10 x 10 um (XY Scanner - low voltage), 12 um (Z Scanner - high voltage), 1.7 um (Z Scanner - low voltage)
  • Operating Mode(s): True Non-Contact AFM
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Other Companies that sell Atomic Force Microscopes (AFM Microscope)

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  • Agilent Technologies
  • attocube systems AG
  • Carl Zeiss Microscopy
  • Nanonics Imaging Ltd
  • Nanosurf AG
  • Park Systems Inc
  • WITec GmbH

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