X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
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Rigaku Americas Corporation
- 3 kW sealed X-ray tube
- two-axis goniometer
- D/teX Ultra 1000
Rigaku Americas Corporation
- Cu, Co, Fe, or Cr, 40 kV, 15 mA
- Vertical, Theta or 2Theta
- D/teX, Ultra 1D High speed silicon strip detector
Rigaku Americas Corporation
- Compact 800 W generator and compact X-ray tube
- Θ-Θ sample horizontal goniometer
- D/teX Ultra silicon strip
Rigaku Americas Corporation
- 9.0 kW Rotating Anode Generator
- High Resolution Theta/Theta Closed Loop
- D/teX Ultra 250 silicon strip detector
Rigaku Americas Corporation
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- HyPix-400 2D, D/teX Ultra 250 1D
Rigaku Americas Corporation
- Standard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometer
- Rugged two-axis goniometer with fixed detector
- HyPix-Bantam two-dimensional semiconductor X-ray detector
Rigaku Americas Corporation
- MicroMax-007 HF microfocus rotating anode source or the highest-flux in-house X-ray source, the FR-X (Mo, Cu, or Cr).
- Fast kappa geometry goniometer
- HyPix-6000HE, the large theta coverage HyPix-Arc 150° or the Dectris EIGER 4M.
Rigaku Americas Corporation
- Dual wavelength X-ray source
- kappa goniometer
- HPC detector
Rigaku Americas Corporation
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- Single rotation axis
- High-speed, high-sensitivity photon-counting detector, HyPix-ED
Rigaku Americas Corporation
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- HyPix-Bantam
Rigaku Americas Corporation
Rigaku Americas Corporation
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