PI nano™ XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications.
Features
- Low Profile for Easy Integration: 20 mm (0.8")
- Up to 200 x 200 x 200 µm Travel Ranges
- Large Clear Aperture for 3 x 1" Slides
- Recessed Sample Holders for Maximized Utility Available
- Outstanding Lifetime Due to PICMA®Piezo Actuators
- Cost-Effective Design due to Piezoresistive Sensors
- Compatible w/ Leading Image Acquisition Software Package
- Closed-Loop Control for High Repeatability and Accuracy
- Millisecond Step Time, Ideal for Super-Resolution Microscopy
- 24-Bit Controller w/ USB, Ethernet, RS-232 Interface and Analog Control
- Available Manual Long-Travel Stage with Motor Upgrade Option
Cost Effective Design, High Performance
PI nano™ series piezo positioning stages are designed to provide high performance at minimum cost. For highly-stable, closed loop operation, piezoresistive sensors are applied directly to the moving structure and precisely measure the displacement of the stage platform. The very high sensitivity of these sensors provides optimum position stability and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity compared to conventional piezoresistive sensor controllers.
High Reliability and Long Lifetime
The compact P-545 systems are equipped with preloaded PICMA® high-performance piezo actuators which are integrated into a sophisticated, FEA-modeled, flexure guiding system. The PICMA® actuators feature cofired ceramic encapsulation and provide better performance and reliability than conventional piezo actuators. Actuators, guidance and sensors are maintenance-free, not subject to wear and offer extraordinary reliability.