Dynamic light scattering particle size analyzers are used to measure the size of very small particles (0.6 nm to 6 um) in solution. This class of particle size analyzer interprets particles’ sizes from the fluctuations in scattered laser light created by the particles’ Brownian motion. Dynamic light scattering analysis is used in medical, biological research and materials science applications, and is also known as photon correlation spectroscopy or quasi-electron light scattering.
Although requiring suspension in a solution, particle size analysis by dynamic light scattering offers the advantage of measuring particles across a wide range of densities, from parts-per-million up to 40% of solution. Other advantages include size analysis of particles in their native environment and micro-liter scale minimum sample sizes. In addition, dynamic light scattering particle size analyzers may also provide information on particle shape and require less user training. Analysis times typically vary from 30 seconds to 2 minutes per sample.
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Bettersize Instruments Ltd.
- 0.3 nm to 15 µm
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- 50 mW Solid-state laser, 671 nm†, Class 1
Malvern Panalytical
- 0.3 nm to 10 µm (diameter)2
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Waters | Wyatt Technology
- 0.2 to 1000 nm
- 15 seconds typical
- 785 nm laser, programmable 10% to 100%
Bettersize Instruments Ltd.
- 0.3nm - 15µm
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Bettersize Instruments Ltd.
- 0.3 nm - 15 um (DLS); 1 um - 50 um (Sedimentation)
- 1-2 minutes (microrheology)
- 50 mW Solid-state laser, 671 nm, Class 1
Brookhaven Instruments Corporation
Brookhaven Instruments Corporation
- 1 nm to 6 um diameter
- 1-2 minutes typical
- 40 mW temperature-controlled semiconductor laser
Brookhaven Instruments Corporation
- 0.3 nm to 10 µm
- 1-2 minutes typical
- 40 mW red diode laser, 640 nm
Brookhaven Instruments Corporation
- <0.6 nm to 10 um (at 173 degrees); 1 nm to 6 um (at 90 degrees)
- 1-2 minutes typical
- 40 mW red diode laser, nominal 640 nm wavelength
Brookhaven Instruments Corporation
- < 0.3 nm to 10 µm (DLS), 1 nm to 100 µm (Zeta)
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- 40 mW 640 nm temperature-controlled solid-state semiconductor laser. Alternative wavelengths available
Brookhaven Instruments Corporation
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- Seconds to minutes
- 40 mW red diode laser, nominal 640 nm wavelength
Entegris
- 0.3 nm to 10 µm
- ~2 minutes
- 12 mW red laser diode (standard); optional 15, 35, 50, 100 mW red or 50, 100 mW green
Genizer LLC
- 1nm-10µm
- Fewer than 4 minutes
- Blue laser and green laser
HORIBA ABX Inc
- 0.3 nm to 10 µm
- Approximately 2 minutes
- Diode pumped frequency doubled laser, 532 nm (10 mW S2/Z2, 100 mW HS2/HZ2)
Malvern Panalytical
- 0.3 nm - 15 um
- Adaptive Correlation (automatic optimization)
- He-Ne laser 633 nm; 4 mW (Blue Label) / 10 mW (Red Label)
Malvern Panalytical
- 0.3 nm - 10 um
- Adaptive Correlation (automatic optimization)
- He-Ne laser 633 nm; 4 mW (Blue Label) / 10 mW (Red Label)
Malvern Panalytical
- 0.3 nm to 10 µm (diameter)2
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- Inquire
Malvern Panalytical
- 0.3 nm - 15 um
- Adaptive Correlation (automatic optimization)
- He-Ne laser 633 nm; 4 mW (Blue Label) / 10 mW (Red Label)
Sympatec
- 0.5 nm - 10,000 nm
- < 1 - 3 min typical
- Laser
Waters | Wyatt Technology
- 0.5 to 1000 nm
- Measurement Time: 5 to 60 seconds per well
830 nm - 830 nm, fiber-coupled diode laser
Waters | Wyatt Technology
- 0.5 to 1000 nm
- 1 to 3600 seconds per well per read
- 830 nm laser, programmable 10% to 100%
Waters | Wyatt Technology
- 0.2 to 1000 nm
- 15 seconds typical
- 785 nm laser, programmable 10% to 100%
Waters | Wyatt Technology
- 0.2 to 1000 nm
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InProcess-LSP
- 15 nm - 5000 nm (FIDES) / 3 nm - 5000 nm (THALIA)
- < 5 seconds per datapoint (real-time continuous)
- Laser (SR-DLS)
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Malvern Panalytical
- 0.3 nm to 10 µm
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Microtrac
- 0.3 nm - 10 µm
- Fast measurement (real-time capable)
- 780 nm laser diode, 3 mW
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Microtrac
- 0.3 nm - 10 µm
- Fast measurement
- 780 nm laser diode, 3 mW; 2 laser diodes with zeta
Inquire
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